Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB experiments provide direct estimates of the gateset circuit fidelity, a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gateset. We also prove that, in the limit of high-fidelity single-qubit experiments, the difficulty introduced by gate-dependence reduces to a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these result hold for higher dimensions.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB experiments provide direct estimates of the gateset circuit fidelity, a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gateset. We also prove that, in the limit of high-fidelity single-qubit experiments, the difficulty introduced by gate-dependence reduces to a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these result hold for higher dimensions.
Randomized benchmarking (RB) protocols have become an essential tool for providing a meaningful partial characterization of experimental quantum operations. While the RB decay rate is known to enable estimates of the average fidelity of those operations under gate-independent Markovian noise, under gate-dependent noise this rate is more difficult to interpret rigorously. In this paper, we prove that single-qubit RB decay parameter p coincides with the decay parameter of the gate-set circuit fidelity , a novel figure of merit which characterizes the expected average fidelity over arbitrary circuits of operations from the gate-set. We also prove that, in the limit of high-fidelity single-qubit experiments, the possible alarming disconnect between the average gate fidelity and RB experimental results is simply explained by a basis mismatch between the gates and the state-preparation and measurement procedures, that is, to a unitary degree of freedom in labeling the Pauli matrices. Based on numerical evidence and physically motivated arguments, we conjecture that these results also hold for higher dimensions.
Randomized benchmarking (RB) returns a single decay parameter or gate error rate, but when the noise is gate-dependent that parameter is notoriously difficult to interpret. We study RB and related random-circuit benchmarks under small gate-local Markovian noise by factorizing each noisy gate into its ideal action followed by the exponential of a small error generator and then perturbing the RB L matrix, which models the RB decay. For any low-error gate set that satisfies the requirements of RB (it is a sequence-asymptotic unitary 2-design), we show that Pauli-stochastic error rates contribute linearly to the RB decay parameter, while Hamiltonian error rates contribute through a gauge-invariant quadratic form. Pauli-correlation and active generators are absent from the linear term and enter only at higher order. For the single-qubit native gate set {Xπ/2,Yπ/2} we derive this quadratic form explicitly in terms of three first-order gauge-invariant (FOGI) coordinates: the two intrinsic over-rotations and one relational axis-tilt error. The resulting formula explains the dependence of DRB on the sampling distribution and the compilation dependence of CRB. These results turn RB decay rates into interpretable functions of experimentally meaningful elementary error rates.
Quantum computers have the potential to bring about a new age of technology, but in order for them to become a reality, the elephant in the room must be addressed, quantum errors. The complexity of quantum errors grows exponentially as the system size is increased; scalable characterization protocols which work under physically realistic noise are therefore needed to assess and optimize control. \n \nRandomized Benchmarking (RB) is a family of characterization protocols with the requisite qualities. RB protocols are independent of state preparation and measurement (SPAM) errors, and because they extract partial information about the error profiles in the form of figures of merit, they are scalable in the number of qubits. In this thesis, we study these figures of merit under various error models, gate-sets, and sample distributions, to further our understanding of their physical meaning, and to fine-tune the best practice for diagnosing errors in basic gate-sets. \n \nThe first study presented in this thesis looks at the physical meaning of the unitarity under physically realistic gate-dependent noise. Numerically, we demonstrate that under these realistic noise models, the unitarity obtained via Extended RB (XRB) overlaps strongly with the average of the unitarity of the errors over the set of individual operations. \n \nThe second study numerically and analytically proves that the Standard RB (SRB) decay parameter p coincides with the decay parameter of the novel figure of merit gate-set circuit fidelity. We also prove that, in the limit of high-fidelity single-qubit experiments, the disconnect between the average gate fidelity and SRB experimental results is caused by a basis mismatch between the gates and the state-preparation and measurement procedures. \n \nIn the third part of this thesis, we compare the results of two variations of the SRB protocol, one that samples uniformly (SRB) and one that samples non-uniformly (NIST RB) from the Clifford group. We prove that NIST RB produces an exponential fidelity curve that gives different infidelity results than SRB. \n \nThe fourth and final study gives a standard for assessing basic gate-sets. Experimental results are given from the assessment run on super-conducting and ion-trap devices. We also experimentally show how the systematic error bounds can be tightened by accounting for the error's degree of coherence, as well as using weaker randomizing sets.
Characterization of experimental systems is an essential step in developing and improving quantum hardware. A collection of protocols known as Randomized Benchmarking (RB) was developed in the past decade, which provides an efficient way to measure error rates in quantum systems. In a recent paper (arxiv:2010.07974), a general framework for RB was proposed, which encompassed most of the known RB protocols and overcame the limitation on error models in previous works. However, even this general framework has a restriction: it can only be applied to a finite group of gates. This does not meet the need posed by experiments, in particular the demand for benchmarking non-Clifford gates and continuous gate sets on quantum devices. In this work we generalize the RB framework to continuous groups of gates and show that as long as the noise level is reasonably small, the output can be approximated as a linear combination of matrix exponential decays. As an application, we numerically study the fully randomized benchmarking protocol (i.e. RB with the entire unitary group as the gate set) enabled by our proof. This provides a unified way to estimate the gate fidelity for any quantum gate in an experiment.
Randomized benchmarking (RB) is an efficient and robust method to characterize gate errors in quantum circuits. Averaging over random sequences of gates leads to estimates of gate errors in terms of the average fidelity. These estimates are isolated from the state preparation and measurement errors that plague other methods such as channel tomography and direct fidelity estimation. A decisive factor in the feasibility of randomized benchmarking is the number of sampled sequences required to obtain rigorous confidence intervals. Previous bounds were either prohibitively loose or required the number of sampled sequences to scale exponentially with the number of qubits in order to obtain a fixed confidence interval at a fixed error rate. Here, we show that, with a small adaptation to the randomized benchmarking procedure, the number of sampled sequences required for a fixed confidence interval is dramatically smaller than could previously be justified. In particular, we show that the number of sampled sequences required is essentially independent of the number of qubits and scales favorably with the average error rate of the system under investigation. We also investigate the fitting procedure inherent to randomized benchmarking in light of our results and find that standard methods such as ordinary least squares optimization can give misleading results. We therefore recommend moving to more sophisticated fitting methods such as iteratively reweighted least squares optimization. Our results bring rigorous randomized benchmarking on systems with many qubits into the realm of experimental feasibility.
Randomized benchmarking (RB) protocols are widely used to measure an average error rate for a set of quantum logic gates. However, the standard version of RB is limited because it only benchmarks a processor's native gates indirectly, by using them in composite n -qubit Clifford gates. Standard RB's reliance on n -qubit Clifford gates restricts it to the few-qubit regime, because the fidelity of a typical composite n -qubit Clifford gate decreases rapidly with increasing n . Furthermore, although standard RB is often used to infer the error rate of native gates, by rescaling standard RB's error per Clifford to an error per native gate, this is an unreliable extrapolation. Direct RB is a method that addresses these limitations of standard RB, by directly benchmarking a customizable gate set, such as a processor's native gates. Here we provide a detailed introduction to direct RB, we discuss how to design direct RB experiments, and we present two complementary theories for direct RB. The first of these theories uses the concept of error propagation or scrambling in random circuits to show that direct RB is reliable for gates that experience stochastic Pauli errors. We prove that the direct RB decay is a single exponential, and that the decay rate is equal to the average infidelity of the benchmarked gates, under broad circumstances. This theory shows that group twirling is not required for reliable RB. Our second theory proves that direct RB is reliable for gates that experience general gate-dependent Markovian errors, using similar techniques to contemporary theories for standard RB. Our two theories for direct RB have complementary regimes of applicability, and they provide complementary perspectives on why direct RB works. Together these theories provide comprehensive guarantees on the reliability of direct RB.