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arXiv:physics/0608055 · Journal of Physics B Atomic Molecular and Optical Physics

Electronic detection of charged particle effects in a Penning trap

D. Winters, Manuel Vogel, D. M. Segal, Richard Claude Thompson

Published Jul 11, 2006• 36 citations
arXivHTMLPDF

Abstract

We present a thorough analysis of the electronic detection of charged particles, confined in a Penning trap, via image charges induced in the trap electrodes. Trapping of charged particles in an electrode structure leads to frequency shifts, which are due to image charge and space charge effects. These effects are of importance for Penning trap experiments which involve high charge densities or require high precision in the motional frequencies. Our analysis of image charges shows that only (higher order) odd powers of the particle displacement lead to induced charge differences, giving rise to a signal. This implies that, besides the centre-of-mass frequency of a trapped particle cloud, also higher order individual particle frequencies induce a signal, which can be picked up by an electronic detection circuit attached to the trap electrodes. We also derive analytic expressions for the image charge and space charge induced frequency shifts and perform simulations of space charge effects. In relation to this, we discuss the consequences of the shifted particle frequencies for resistive cooling of the particle motion.

DOI
10.1088/0953-4075/39/14/019

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We present a thorough analysis of the electronic detection of charged particles, confined in a Penning trap, via image charges induced in the trap electrodes. Trapping of charged particles in an electrode structure leads to frequency shifts, which are due to image charge and space charge effects. These effects are of importance for Penning trap experiments which involve high charge densities or require high precision in the motional frequencies. Our analysis of image charges shows that only (higher order) odd powers of the particle displacement lead to induced charge differences, giving rise to a signal. This implies that, besides the centre-of-mass frequency of a trapped particle cloud, also higher order individual particle frequencies induce a signal, which can be picked up by an electronic detection circuit attached to the trap electrodes. We also derive analytic expressions for the image charge and space charge induced frequency shifts and perform simulations of space charge effects. In relation to this, we discuss the consequences of the shifted particle frequencies for resistive cooling of the particle motion.
We present a method for measuring ion-oscillation frequencies in quadrupole traps (Paul, Penning, and combined traps). The method depends on a statistical analysis of the delays between detected fluorescence photons. We have used the method to verify the oscillation frequencies for magnesium ions in a Penning trap as a function of the dc voltage applied to the trap electrodes. We demonstrate that, as expected, the method measures the space-charge shifted (individual-ion) oscillation frequency and not the frequency at which the ion cloud as a whole moves. However, our data suggest that for most of our operating conditions, the space-charge shift is negligible. We also discuss the effect of the contact potential arising from areas of the trap electrodes that are coated by excess Mg from the atomic beam used. We show that this extra potential shifts the center of the Penning trap and makes it unstable for low values of the applied voltage.
We report on the measurement of the high frequency properties of a planar Penning ion trap fabricated on a chip. Two types of chips have been measured: the first manufactured by photolithographic metal deposition on a p-doped silicon substrate and the second made with printed circuit board technology on an alumina substrate. The input capacitances and the admittances between the different trap's electrodes play a critical role in the electronic detection of the trapped particles. The measured input capacitances of the photolithographic chip amount to 65-76 pF, while the values for the printed circuit board chips are in the range of 3-5 pF. The latter are small enough for detecting non-destructively a single trapped electron or ion with a specifically tuned LC resonator. We have also measured a mutual capacitance of ∼85 fF between two of the trap's electrodes in the printed circuit board chip. This enables the detection of single, or very few, trapped particles in a broader range of charge-to-mass ratios with a simple resistor on the chip. We provide analytic calculations of the capacitances and discuss their origin and possible further reduction.
We have developed and applied a novel method for the precise determination of small frequency differences of particle motions inside a Penning trap. In the present case, the frequency differences on the order of 100 mHz at motional frequencies on the order of 1 MHz are used to determine the spin state of an electron bound in a hydrogen-like ion. This novel technique measures the integrated phase difference of the particles' motions relative to an excitation with a well-defined phase. Thereby, the Fourier-limit for frequency measurements based on Fourier-analyses of detection signals can be overcome.
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Nondestructive detection of single-electron motion is crucial for quantum information processing with electrons trapped in Paul traps. The standard approach in Penning traps is to detect the image current induced on the trap electrodes by the electron's oscillatory motion. However, applying this approach in Paul traps for single electrons is currently hindered by motional frequency fluctuations arising from trap anharmonicities and instabilities in the rf trapping field. In this work, we propose a robust detection scheme exploiting the transient dynamics of parametric driving to overcome these limitations. Distinct from traditional steady-state approaches, our method focuses on the transient regime to break the temporal constraints imposed by steady-state assumptions, thereby enabling fast readout. We show that a controlled ramp of the parametric drive effectively locks the frequency of the electron motion in the transient regime, rendering the signal highly resilient to realistic experimental noise and inherent micromotion. This work paves the way for the experimental realization of nondestructive detection of single-electron motion in Paul traps.