An application of quantum metrology: enhanced correlated interferometry

Siva T. Pradyumna

Published Jun 14, 2019• 0 citations

Abstract

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Quantum enhanced optical measurements

Elena Losero

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Enrico Rebufello

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Novel devices and methods for quantum resistance and impedance metrology

Martina Marzano

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Applications in optical quantum metrology (Conference Presentation)

Thomas Gerrits

Engineering quantum computing technologies: from compact modelling to applications

Giovanni Amedeo Cirillo

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Enhanced metrology using quantum-correlated matter

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