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Integrated SPAD-Based Entropy Source Using an On-Chip Trigger Diode for QRNG (Quantum Random Number Generator)

Benjamin Saft, Alexander Zimmer, Jakob Hampel, Daniel Gäbler, Maximilian Wiener, Eric Schäfer

Published Jun 16, 2026• 0 citations
Publisher
DOI
10.13140/rg.2.2.33342.86089

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For globally connected devices like smart phones, personal computers and Internet-of-things devices, the ability to generate random numbers is essential for execution of cryptographic protocols responsible for information security. Generally, a random number generator should be small, robust, utilize as few hardware and energy resources as possible, yet provide excellent randomness at a high enough speed (bitrate) for a given purpose. In this work we present a quantum random number generator (QRNG) which makes use of a photoelectric effect in single-photon avalanche diodes (SPADs) as a source of randomness and is scalable to any desired bitrate. We use the random flip-flop method in which random bits are obtained by periodic sampling of a randomly toggling flip-flop. For the first time we investigate this method in detail and find that, out of two main imperfections, bias is due only to hardware imperfections while autocorrelation predominantly resides with the method itself. SPADs are integrated on a silicon chip together with passive quenching and digital pulse-shaping circuitry, using a standard 180 nm CMOS process. A separate FPGA chip derives random numbers from the detection signals. The basic QRNG cell, made of only two SPADs and a few logic circuits, can generate up to 20 Mbit/s that pass NIST statistical tests without any further postprocessing. This technology allows integration of a QRNG on a single silicon chip using readily available industrial processes.
Quantum random number generators (QRNGs) are a burgeoning technology used for a variety of applications, including modern security and encryption systems. Typical methods exploit an entropy source combined with an extraction or bit generation circuit in order to produce a random string. In integrated designs, there is often little modeling or analytical description of the entropy source, circuit extraction, and post-processing provided. In this work, we present a single-photon avalanche diode (SPAD)-based QRNG design, which utilizes the quantum random flip-flop (QRFF) method. Extensive modeling of detector and circuit imperfections that result in entropy degradation is performed. A new method to analytically model serial autocorrelations of the proposed bit generation method, which includes detector dead time, is proposed. Then, a Verilog-AMS model is developed in order to validate the analytical model in simulation. A novel transistor implementation of the QRFF circuit is presented, which enables compensation of the degradation in entropy inherent to the finite non-symmetric transitions of the random flip-flop. Finally, a full system containing two independent arrays of the QRFF circuit is manufactured and tested in a 55-nm bipolar–CMOS–DMOS (BCD) technology node, demonstrating bit generation statistics that are commensurate to the developed model. The full chip is able to generate 3.3 Gb/s of data when operated with an external LED. Pixelwise and spatial analysis of bias and correlation is performed. NIST STS (SP 800-22) and SP 800-90B are used to benchmark the generated bit strings.