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Nanotechnology

A review of design principles and fabrication techniques in superconducting and trapped ion quantum devices

Aashay Somdatta Pandharpatte, Manpreet Singh, Amit Saxena

Published Jun 16, 2026• 0 citations
Publisher

Abstract

Quantum computing is rapidly evolving from theoretical frameworks to functional hardware, with physical qubits now being realized across multiple experimental platforms. Precision nanofabrication has enabled the development of low-loss, high-coherence quantum devices. Among the various approaches, superconducting circuits and trapped-ion systems have emerged as the most advanced and experimentally successful platforms for realizing controllable and scalable qubits. This review presents an overview of nanoscale fabrication techniques employed in these two architectures. We first outline the operating principles that define qubit behavior, followed by a discussion of representative device designs and fabrication workflows. In superconducting circuits, we examine processes such as thin-film deposition, lithographic patterning, and Josephson-junction fabrication that determine key parameters including qubit frequency, anharmonicity, and coherence. For trapped-ion systems, we describe the transition from bulk electrode assemblies to microfabricated surface traps produced using photolithography, metal deposition, and dielectric layering, where electrode geometry and surface treatment directly influence ion confinement and motional heating. We further discuss fabrication-related challenges, including dielectric loss, surface contamination, and material defects that limit coherence and reproducibility, along with emerging mitigation strategies such as advanced cleaning, low-loss materials, and improved surface engineering. By drawing parallels between these two leading platforms, this review highlights that continued progress in nanofabrication remains central to realizing scalable, high-fidelity quantum processors.

DOI
10.1088/1361-6528/ae7df7

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Trapped ions within Paul traps have shown to be a promising architecture in the realisation of a quantum information processor together with the ability of providing quantum simulations. Linear Paul traps have demonstrated long coherence times with ions being well isolated from the environment, single and multi-qubit gates and the high fidelity detection of states. The scalability to large number of qubits, incorporating all the previous achievements requires an array of linear ion traps. Microfabrication techniques allow for fabrication and micron level accuracy of the trap electrode dimensions through photolithography techniques. The first part of this thesis presents the experiential setup and trapping of Yb+ ions needed to test large ion trap arrays. This include vacuum systems that can host advanced symmetric and asymmetric ion traps with up to 90 static voltage control electrodes. Demonstration of a single trapped Yb+ ion within a two-layer macroscopic ion trap is presented. with an ion-electrode distance of 310(10) µm. The anomalous heating rate and spectral noise density of the trap was measured, a main form of decoherence within ion traps. The second half of this thesis presents the design and fabrication of multi-layer asymmetric ion traps. This allows for isolated electrodes that cannot be accessed via surface pathways, allowing for higher density of electrodes as well as creating novel trap designs that allow for the potential of quantum simulations to be demonstrated. These include two-dimensional lattices and ring trap designs in which the isolated electrodes provide more control in the ion position. For the microfabrication of these traps I present a novel high-aspect ratio electroplated electrode design that provides shielding of the dielectric layer. This provides a means to mitigate stray electric field due to charge build up on the dielectric surfaces. Electrical testing of the trap structures was performed to test bulk breakdown and surface flashover of the ion trap architectures. Results showed sufficient isolation between electrodes for both radio frequency and static breakdown. Surface flashover voltage measurements over the dielectric layer showed an improvement of more than double over previous results using a new fabrication technique. This will allow for more powerful ion trap chips needed for the next generation of microfabricated ion trap arrays for scalable quantum technologies.