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Quantum Computing, Communication, and Simulation

Underpinning optical metrology for quantum photonics

Angela Gamouras, M. G. White, Nathan A. Tomlin, Michelle S. Stephens, John H. Lehman, Jeongwan Jin, Philip J. Poole, Dan Dalacu, Robin L. Williams

Published Mar 5, 2026• 0 citations
Publisher

Abstract

Quantum photonics technologies have realized great advancements over the past decade. Quantum photonic integrated circuits, devices which incorporate single-photon emitters, detectors and optical components on a single device, are already being implemented in quantum computing and networking hardware. The verification and validation of system performance, including the characterization of single-photon sources and the efficiency of single-photon detectors is an ongoing challenge, especially for integrated devices. One approach to characterizing a single-photon source is to measure the optical power of the emitted photons, which can be applied in turn to the characterization of on-chip components within an integrated quantum photonics platform. This presentation will address the development of metrological devices and measurement techniques, where an ultra-sensitive radiometer chip directly measures the optical power of photons emitted from a quantum dot single-photon source. This measurement technique demonstrates the feasibility of implementing optical power measurements of on-demand single photon sources in the verification and validation of quantum photonics systems.

DOI
10.1117/12.3079324

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Quantum photonics technologies have realized great advancements over the past decade. Quantum photonic integrated circuits, devices which incorporate single-photon emitters, detectors and optical components on a single device, are already being implemented in quantum computing and networking hardware. The verification and validation of system performance, including the characterization of single-photon sources and the efficiency of single-photon detectors is an ongoing challenge, especially for integrated devices. One approach to characterizing a single-photon source is to measure the optical power of the emitted photons, which can be applied in turn to the characterization of on-chip components within an integrated quantum photonics platform. This presentation will address the development of metrological devices and measurement techniques, where an ultra-sensitive radiometer chip directly measures the optical power of photons emitted from a quantum dot single-photon source. This measurement technique demonstrates the feasibility of implementing optical power measurements of on-demand single photon sources in the verification and validation of quantum photonics systems.
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The capability of realizing quantum photonics implementations on-chip will have a strong impact on several aspects of quantum computation and information processing. The implementation of large scale integrated quantum photonic technologies requires on-chip reconfigurable waveguide circuits as well as single-photon sources and detectors. Many successes have been made in recent years to demonstrate complex quantum circuits in many material platforms. Among all these platforms, the Silicon-on-Insulator (SOI) platform is outstanding as it is well developed for classical applications and therefore deploys a high component density, mature fabrication techniques and compatibility with the telecom regime and the complementary metal-oxide-semiconductor (CMOS) technology. However, the lack of on-demand non-classical light sources, directly incorporated in silicon chips, forces the use of nonlinear processes to generate non-classical light states: the probabilistic nature of the emission process sets a limit in the maximally achievable experimental complexity. The use of on-demand sources will have a strong impact on the device’s scalability.
We will present our current efforts on single photon quantum metrology using high-efficiency superconducting detectors and high-efficiency single-photon sources based on spontaneous parametric downconversion. Optical power measurements based on single photon counting could establish a quantum standard for optical power calibration in the future. At NIST we are pursuing the development of single photon sources and single photon detectors for metrology, quantum and classical applications. As part of these efforts, we are pursuing the establishment of a measurement service for the calibration of single photon detectors. We present how our calibration is tied to the calibration of our transfer standard optical fiber power meters. Using the beamsplitter method, we have implemented a fiber-coupled and free-space measurement system. Also, we have developed testbeds and measurement protocols for the characterization of single photon sources and single photon detectors. We will review several methods, which allow for the characterization of the spatial and spectral degree of freedom in spontaneous parametric downconversion.
In recent years, research on integrated quantum circuits has developed rapidly and exciting results have been achieved. The overarching goal of this emerging research direction in the field of modern quantum technology is the scalable integration of quantum functionality on robust chips. Such chips can work independently of one another, but it is even more interesting to develop them modularly for integration into larger quantum networks, thereby linking quantum computation and quantum communication in the same framework. In this context, the ongoing development and further optimization of integrated quantum circuits aim, inter alia, to achieve a quantum advantage in the area of quantum computing and to pave the way for multipartite quantum networks. The functionality of such chips is essentially based on single-photon operations, such as interference at beam splitters in combination with phase shifters in the field of linear optical quantum computing and Bell-state measurements for entanglement swapping in long-distance quantum networks. While individual functionalities such as CNOT gates and more complex quantum computing operations such as boson sampling in a combination of waveguide chips and external photon sources and detectors were successfully demonstrated, the field is currently facing the major challenge of integrating all necessary components monolithically on chip in order to exploit the full potential of integrated quantum nanophotonics. The present Perspective discusses the status and the present challenges of integrated quantum nanophotonics based on on-demand single-photon emitters and gives an outlook on required developments to enter the next level of fully functional quantum circuits for photonic quantum technology.
Optical chips for quantum photonics are cutting-edge technology, merging photonics and quantum mechanics to manipulate light at the quantum level. These chips are crucial for advancing quantum computing, secure communication, and precision sensing by integrating photonic components such as waveguides, beam splitters, and detectors to manipulate single photons, the fundamental carriers of quantum information. Key advancements in optical chips include low-loss waveguides, efficient single-photon sources, and high-fidelity quantum gates, all essential for scalable quantum circuits. Integrating these circuits on a chip offers significant advantages in miniaturization, stability, and reproducibility over traditional bulk optics setups. Recent breakthroughs in materials science and nanofabrication have propelled the field forward, enabling the production of chips with higher precision and lower defect rates. Silicon photonics, in particular, has become a prominent platform due to its compatibility with existing semiconductor manufacturing processes, facilitating the integration of quantum photonic circuits with classical electronic systems. Here, we share our vision of the future of optical chips for quantum photonics, which hold promise for various applications. In quantum computing, they enable the development of compact and scalable quantum processors. In communication, they provide the foundation for ultra-secure quantum networks through quantum key distribution. In sensing, they allow for high-precision measurements that surpass classical limits. As research progresses, optical chips are expected to play a critical role in realizing the full potential of quantum technologies.
The goal of integrated quantum photonics is to combine components for the generation, manipulation, and detection of nonclassical light in a phase-stable and efficient platform. Solid-state quantum emitters have recently reached outstanding performance as single-photon sources. In parallel, photonic integrated circuits have been advanced to the point that thousands of components can be controlled on a chip with high efficiency and phase stability. Consequently, researchers are now beginning to combine these leading quantum emitters and photonic integrated circuit platforms to realize the best properties of each technology. In this paper, we review recent advances in integrated quantum photonics based on such hybrid systems. Although hybrid integration solves many limitations of individual platforms, it also introduces new challenges that arise from interfacing different materials. We review various issues in solid-state quantum emitters and photonic integrated circuits, the hybrid integration techniques that bridge these two systems, and methods for chip-based manipulation of photons and emitters. Finally, we discuss the remaining challenges and future prospects of on-chip quantum photonics with integrated quantum emitters.