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Single-photon quantum metrology (Conference Presentation)

Thomas Gerrits

Published Mar 5, 2019• 0 citations
Publisher

Abstract

We will present our current efforts on single photon quantum metrology using high-efficiency superconducting detectors and high-efficiency single-photon sources based on spontaneous parametric downconversion. Optical power measurements based on single photon counting could establish a quantum standard for optical power calibration in the future. At NIST we are pursuing the development of single photon sources and single photon detectors for metrology, quantum and classical applications. As part of these efforts, we are pursuing the establishment of a measurement service for the calibration of single photon detectors. We present how our calibration is tied to the calibration of our transfer standard optical fiber power meters. Using the beamsplitter method, we have implemented a fiber-coupled and free-space measurement system. Also, we have developed testbeds and measurement protocols for the characterization of single photon sources and single photon detectors. We will review several methods, which allow for the characterization of the spatial and spectral degree of freedom in spontaneous parametric downconversion.

DOI
10.1117/12.2511977

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We will present our current efforts on single photon quantum metrology using high-efficiency superconducting detectors and high-efficiency single-photon sources based on spontaneous parametric downconversion. Optical power measurements based on single photon counting could establish a quantum standard for optical power calibration in the future. At NIST we are pursuing the development of single photon sources and single photon detectors for metrology, quantum and classical applications. As part of these efforts, we are pursuing the establishment of a measurement service for the calibration of single photon detectors. We present how our calibration is tied to the calibration of our transfer standard optical fiber power meters. Using the beamsplitter method, we have implemented a fiber-coupled and free-space measurement system. Also, we have developed testbeds and measurement protocols for the characterization of single photon sources and single photon detectors. We will review several methods, which allow for the characterization of the spatial and spectral degree of freedom in spontaneous parametric downconversion.
A system for calibrating single photon detector efficiency that is traceable to the SI through a state-of-the-art classical optical fibre radiometer has been developed and is in the process of being vetted as a calibration service at the National Institute of Standards and Technology (NIST). The method of calibration is direct substitution to power meters relative to NIST's optical fibre cryogenic primary standard and builds on the existing measurement infrastructure for the calibration of optical fibre power meters. Recent improvements to the optical fibre cryogenic radiometer make it more robust and deployable. The traceability of the single photon detector calibration service under development to these classical measurements is discussed, along with a description of the technique used in this calibration service to calibrate the detection efficiency of single photon detectors. Finally, we discuss work on the development of these technologies so that in the future they may be deployable to the point-of- use.
Many of the schemes under study for Quantum Information Processing technology based on photon states involve active and passive optical components as well as detectors. In order to able to establish fidelity levels for these schemes, the performance of the optical components and the quantum efficiency (q.e.) of the detectors require careful and accurate characterization. Correlated photons produced from spontaneous parametric downconversion, which are also the basis of entangled photon states, conveniently offer a direct means of measuring detector q.e. in the photon counting regime, while stimulated parametric downconversion can be used to measure source radiance. Detector and source calibration using correlated photon techniques therefore addresses some of the key issues critical to the development of QIP technology and the development of correlated/entangled photon metrology. This paper reports work being undertaken at NPL to establish the accuracy limitations of these correlated photon techniques. Significant sources of uncertainty are the need to measure losses due to any optical components used and the requirement to obtain and maintain good geometrical and spectral alignment.
Many of the schemes under study for Quantum Information Processing technology based on photon states involve active and passive optical components as well as detectors. In order to able to establish fidelity levels for these schemes, the performance of the optical components and the quantum efficiency (q.e.) of the detectors require careful and accurate characterization. Correlated photons produced from spontaneous parametric downconversion, which are also the basis of entangled photon states, conveniently offer a direct means of measuring detector q.e. in the photon counting regime, while stimulated parametric downconversion can be used to measure source radiance. Detector and source calibration using correlated photon techniques therefore address some of the key issues critical to the development of QIP technology and the development of correlated/entangled photon metrology. This paper reports work being undertaken at NPL to establish the accuracy limitations of these correlated photon techniques. Significant sources of uncertainty are the need to measure losses due to any optical components used and the requirement to obtain and maintain good geometrical and spectral alignment.
Quantum photonics technologies have realized great advancements over the past decade. Quantum photonic integrated circuits, devices which incorporate single-photon emitters, detectors and optical components on a single device, are already being implemented in quantum computing and networking hardware. The verification and validation of system performance, including the characterization of single-photon sources and the efficiency of single-photon detectors is an ongoing challenge, especially for integrated devices. One approach to characterizing a single-photon source is to measure the optical power of the emitted photons, which can be applied in turn to the characterization of on-chip components within an integrated quantum photonics platform. This presentation will address the development of metrological devices and measurement techniques, where an ultra-sensitive radiometer chip directly measures the optical power of photons emitted from a quantum dot single-photon source. This measurement technique demonstrates the feasibility of implementing optical power measurements of on-demand single photon sources in the verification and validation of quantum photonics systems.
Calibration of fiber-coupled single-photon detectors usually requires knowledge of the input photon flux inside the fiber and/or knowledge of the linearity of a reference power meter. Many approaches have been presented in the past to accurately measure the photon detection probability of a single photon detector [1-6]. Under certain assumptions, one can utilize waveguide-coupled single photon detectors and a series of photon-counting measurements and a single-photon source to calibrate the detection efficiency of a single photon detector without the need of a reference power meter and the knowledge of the incoming photon flux. Here, this method is presented. Furthermore, if a reference detector is used, the detection efficiency of all evanescently coupled waveguide detectors can be measured, and the measurement outcome does not depend on splicing or fiber connection losses within in the setup, i.e., the measurement is setup-independent. In addition, the method, when using a reference detector, can be utilized to measure and distinguish between the absorption of a waveguide-coupled single photon detector and its internal detection efficiency. [1] A. J. Miller et al, Opt. Express 19, 9102–9110 (2011) [2] I. Muller et al., Metrologia 51, S329 (2014). [3] A. L. Migdall, Instrumentation and Measurement, IEEE Transactions on 50, 478–481 (2001). [4] S. V. Polyakov, A. L. Migdall, Optics Express 15, 1390–1407 (2007). [5] A. Avella et al., Optics Express 19, 23249–23257 (2011). [6] T. Lunghi et al., Opt. Express 22, 18078-18092 (2014)