Optical and Quantum Sensing and Precision Metrology II
Optical quantum network metrology: from component testing to quantum network metrology
Thomas Gerrits
Abstract
The presentation will cover our efforts towards the metrology of quantum networks and review the metrology tools developed in our labs at NIST for quantum component and quantum network characterization, including the characterization of single-photon sources and detectors, quantum network node synchronization and entanglement distribution augmented by quantum network management and control.