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Optics Letters

Doppler-free spectroscopy of the Cs 6S 1/2 → 7P 3/2 atomic transition at 456 nm in a nanometric-thick vapor layer

Armen D. Sargsyan, Emmanuel Klinger, Rodolphe Boudot, David G. Sarkisyan

Published Apr 14, 2025• 11 citations
Publisher

Abstract

The features of Doppler-free resonances detected by probing the 133 Cs atom 6S 1/2 → 7P 3/2 transition at 456 nm in a nanometric-thick vapor layer are investigated. The matrix element of this transition is about 11 times smaller than that of the Cs D 2 line (852 nm). When the vapor layer thickness is ℓ = λ /2 ≃ 230 nm, we observe Dicke narrowing of the lines, accompanied by a red frequency shift of the atomic transitions, which is attributed to atom–surface interactions. Realizing optical pumping with ℓ ≃ 460 nm in a single-pass configuration, we observe Doppler-free resonances with a linewidth of <20 MHz, located at the atomic transition frequencies, with a correspondence of the amplitudes to the transition intensities. These narrow resonances are of interest for high-resolution spectroscopy and instrumentation and could serve as a frequency reference.

DOI
10.1364/ol.558536

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Acta Physica Polonica A•Nov 1, 2007•0 citations
The features of Doppler-free resonances detected by probing the 133 Cs atom 6S 1/2 → 7P 3/2 transition at 456 nm in a nanometric-thick vapor layer are investigated. The matrix element of this transition is about 11 times smaller than that of the Cs D 2 line (852 nm). When the vapor layer thickness is ℓ = λ /2 ≃ 230 nm, we observe Dicke narrowing of the lines, accompanied by a red frequency shift of the atomic transitions, which is attributed to atom–surface interactions. Realizing optical pumping with ℓ ≃ 460 nm in a single-pass configuration, we observe Doppler-free resonances with a linewidth of <20 MHz, located at the atomic transition frequencies, with a correspondence of the amplitudes to the transition intensities. These narrow resonances are of interest for high-resolution spectroscopy and instrumentation and could serve as a frequency reference.
Doppler-free spectroscopy of the Cs 6S1/2−7P3/26\text{S}_{1/2}-7\text{P}_{3/2}6S1/2​−7P3/2​ atomic transition at 456 nm in a nanometric-thick vapor layer
The features of Doppler-free resonances detected by probing the 133^{133}133Cs atom 6S1/2−7P3/26S_{1/2}-7P_{3/2}6S1/2​−7P3/2​ transition at 456 nm in a nanometric-thick vapor layer are investigated. The matrix element of this transition is about 11 times smaller than that of the Cs D2_22​ line (852 nm). When the vapor layer thickness is ℓ=λ/2≃230\ell = λ/2 \simeq 230ℓ=λ/2≃230 nm, we observe Dicke narrowing of the lines, accompanied by a red frequency shift of the atomic transitions, which is attributed to atom-surface interactions. Realizing optical pumping with ℓ≃460\ell\simeq 460ℓ≃460 nm in a single-pass configuration, we observe Doppler-free resonances with a linewidth <20<20<20 MHz, located at the atomic transitions frequencies with a correspondence of the amplitudes to the transition intensities. These narrow resonances are of interest for high-resolution spectroscopy and instrumentation, and could serve as a frequency reference.
Sub-Doppler spectroscopy of the near-UV Cs atom 6S1/2_{1/2}1/2​-7P1/2_{1/2}1/2​ transition in a microfabricated vapor cell
We report on the characterization of sub-Doppler resonances detected by probing the 6S1/2_{1/2}1/2​-7P1/2_{1/2}1/2​ transition of Cs atom at 459 nm in a microfabricated vapor cell. The dependence of the sub-Doppler resonance (linewidth, amplitude) on some key experimental parameters, including the laser intensity and the cell temperature, is investigated. These narrow atomic resonances are of interest for high-resolution spectroscopy, instrumentation, and may constitute the basis of a near-UV microcell optical standard.
We report on the characterization of sub-Doppler resonances detected by probing the 6S1/2 - 7P1/2 transition of the Cs atom at 459 nm in a microfabricated vapor cell. The dependence of the sub-Doppler resonance (linewidth, amplitude) on some key experimental parameters, including the laser intensity and the cell temperature, is investigated. These narrow atomic resonances are of interest for high-resolution spectroscopy and instrumentation and may constitute the basis of a high-stability microcell optical standard.
Abstract Selective reflection (SR) spectroscopy of the 6 s 2 S 1 / 2 → 7 p 2 P 3 / 2 electric dipole transition of Caesium ( λ = 456 nm) is performed for the first time using a nanometric-thin cell (L = 50–1500 nm, T = 200 ∘ C). We successfully form narrow resonances corresponding to the F g = 3 , 4 → F e = 2 , 3 , 4 , 5 hyperfine transitions. All transitions are well spectrally resolved, and the geometry of the cell allows us to obtain a strong 30 times narrowing of the Doppler width with a single beam pass. For lower thicknesses ( L < 400 nm), we observe a red shift of the SR lines, which we attribute to atom-surface interactions, and provide estimates of the C 3 interaction coefficient. The oscillator strengths of the 6 s 2 S 1 / 2 → 7 p 2 P 3 / 2 hyperfine transitions are about two orders of magnitude smaller than that of the Cs D 2 line at 852 nm. Our experimental measurements are in good agreement with theoretical calculations. We emphasize the advantage of nanocell spectroscopy compared to the well-known saturated absorption method and present possible applications.
The saturation behavior of absorption and fluorescence spectra on the D2 line of Cs is presented, demonstrating a significant difference between open and closed transitions. Cs vapor is confined in an extremely thin cell (ETC) with widely tunable thickness L=(0.5-3)λ, where λ is the light wavelength. In the saturation regime, the closed transition demonstrates enhanced absorption in a narrow spectral interval due to the Dicke effect, while the open one demonstrates only a velocity-selective dip in the absorption. The fluorescence of open transitions shows reduced fluorescence dips, enhancing their contrast with ETC thickness. The closed transition exhibits only a small plateau around the optical transition center. Applying two-level theoretical modeling based on optical Bloch equations, a qualitative agreement with experimental observations is achieved. The rate of contrast enhancement with cell thickness is larger for the theoretical than for the experimental dips. In addition, for the closed transition a tiny peak in the fluorescence is theoretically predicted, with the first experimental confirmation presented. The sub-Doppler spectra of vapor layers with a thickness of several light wavelengths show potential for realization of precise frequency references and photonics sensors.
The high resolution spectroscopy of nanometric-thin alkali-vapor layers was made possible through the development of extremely thin cell.We have investigated the behavior of the extremely thin cell fluorescence spectra both experimentally and theoretically.Experiment is performed on the D 2 line of Cs-vapor-layer with thickness L = mλ, where m = 0.5, 0.75, 1, 1.25.For open optical transitions, the fluorescence spectra shows narrow dip on the top of the sub-Doppler-width fluorescence profile, at L ≥ λ.In case of closed transition, an extremely small feature in the fluorescence slightly shifted from its maximum is observed at L = (5/4)λ.The used theoretical model, based on the optical Bloch equations is in qualitative agreement with the experimental observations.