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Physics of the Solid State

Josephson tunnel junctions with integral SIN shunting.

M. S. Shevchenko, Lyudmila V. Filippenko, Oleg S. Kiselev, V. P. Koshelets

Published Jan 1, 2022• 0 citations
Publisher

Abstract

This work is devoted to the study of tunnel Josephson superconductor-insulator-superconductor (SIS) junctions with a new type of shunting based on the usage of an additional superconductor-insulator-normal metal (NIS) junction located around the SIS junction. Numerical calculations of the parameters of such shunted junctions were carried out and modeling of their IVC (current-voltage characteristics) was performed. The designed samples were manufactured, their parameters were studied. To investigate the behavior of junctions under the influence of high-frequency signals in the sub-THz range, their IVCs were measured. Keywords: Superconducting devices, superconductor-insulator-superconductor tunnel junction, Josephson effect, shunting of Josephson junctions.

DOI
10.21883/pss.2022.09.54154.38hh

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Physics of the Solid State•Jan 1, 2022•1 citation
This work is devoted to the study of tunnel Josephson superconductor-insulator-superconductor (SIS) junctions with a new type of shunting based on the usage of an additional superconductor-insulator-normal metal (NIS) junction located around the SIS junction. Numerical calculations of the parameters of such shunted junctions were carried out and modeling of their IVC (current-voltage characteristics) was performed. The designed samples were manufactured, their parameters were studied. To investigate the behavior of junctions under the influence of high-frequency signals in the sub-THz range, their IVCs were measured. Keywords: Superconducting devices, superconductor-insulator-superconductor tunnel junction, Josephson effect, shunting of Josephson junctions.
Abstract This study is devoted to the investigation of tunneling superconductor–insulator–superconductor (SIS) Josephson junctions with a new type of shunt based on an additional superconductor–insulator–normal metal (SIN) junction placed around the SIS junction. In the course of study, the parameters of such shunted junctions are numerically calculated and their current–voltage characteristics (IVC) are simulated. The designed structures are assembled in real samples and their parameters are studied; the IVC of junctions with different degrees of shunting are measured, and the behavior of these junctions under the influence of high-frequency signals in the subterahertz range is studied.
Josephson junctions (JJs) with non-hysteretic I-V characteristic and high critical parameters are required for many applications; in particular, they are needed to create tunable THz range oscillators. We fabricated and studied shunted superconductor-insulator-superconductor (SIS) Nb-AlOx-Nb tunnel junctions with an area of about 1μm2, estimated their parameters, and compared them with theoretical models. To assess the performance of shunted junctions in the terahertz range, their characteristics were studied under the influence of a high-frequency signal; the estimated value of the characteristic voltage for the shunted junction at a high frequency is about 1 mV. To improve the circuit parameters, a new type of the shunting based on application of NIS junctions was proposed, which reduces the influence of parasitic inductance, expands the frequency range of the generator, and decreases the size of the structure. The JJs with a new type of shunting have been fabricated and studied. The niobium integrated circuits intended for matching the superconducting oscillator and an SIS junction as a microwave detector were designed, fabricated, and tested. Such structures are required for studying the spectral characteristics and analyzing the operation of the oscillator. The developed circuits have demonstrated efficient operation at frequencies from 300 to 700 GHz; the experimental results are in good agreement with the simulated characteristics. The results obtained will be implemented for further development of the THz range oscillators.
Within the framework of the microscopic model of tunneling, we modeled the behavior of the Josephson junction shunted by the superconductor--insulator--normal-metal (SIN) tunnel junction. The electromagnetic impedance of the SIN junction includes both the frequency-dependent damping and reactance, which affect the circuit dynamics. We calculated the dc $I\text{\ensuremath{-}}V$ curves and transient characteristics and show their differences to the characteristics obtained within the simpler models. The correct operation of the basic single-flux-quantum circuits, i.e., the Josephson transmission line and the toggle flip-flop, based on such SIN-shunted Josephson junctions with small damping at low frequencies, has also been modeled.
A sidewall shunting method is demonstrated to realize overdamped (i.e., nonhysteretic) current-voltage (IV) characteristics in superconductor-insulator-superconductor (SIS) junctions. Unlike the conventional layout of shunted SIS junctions, patterning a normal metal shunt on one of the sides of the junction considerably reduces the parasitic inductive path and leaves more area on a chip for active components. Using a conventional optical lithography route we have fabricated sidewall shunted SIS junctions of various sizes from NbN–MgO–NbN trilayers on MgO and oxidized Si substrates. In our experiment the effective shunting resistance is realized by a tunnel contact between the shunt metal and the base electrode via a thin layer of insulating MgO. The results of our electrical measurements verify the overdamped nature of the junctions shunted in this manner.
ABSTRACT: Active superconducting circuits based on picoseconds switching, i.e. THz oscillating, Josephson tunnel junctions are expected to find a large domain of applications in spatial sub-millimeter wave and FIR detectors as well as in satellite based wideband signal and data processors. In the first case SIS (superconductor-insulator-superconductor) tunnel junctions are required, while in the second case SNS (superconductor-normal metal-superconductor) self-shunted junctions are preferred. We present the advantages of the nitride junction technology currently developed at CEA-Grenoble, based on high-performance MTS (medium temperature superconductor) NbN films in both SIS and SNS junctions. In the SIS case the device performances rely on a sputter deposited and post-annealed, only 0.5-0.7 nm thick, dielectric MgO barrier. This leads to junctions with a Josephson critical current in the range of 10-25 kA/cm, and a large superconducting energy gap (> 5 meV) associated with a low sub-gap quasi-particle leakage current. These parameters are suitable for low “noise temperature ” heterodyne mixers, local oscillators, and integrated receivers in the 0.8 to 1.4 THz frequency range. In the SNS case, a new
A description of the fabrication technology of high-quality tunnel SIS junctions is presented, with following characteristics: energy gap in superconductors Vg=3.2-3.4 mV, tunnel current density up to J 35 kA/cm2, quality factor Rj/Rn (ratio of subgap resistance to normal-state resistance) up to 30, junction area up to 1 μm2. The SIS junctions are integrated into the NbTiN|SiO2|Al microstrip line. Keywords: superconducting devices, superconductor--insulator--superconductor tunnel junction, plasma etching.