IEEE International Electrical and Energy Conference (CIEEC)
Electrical metrology based on quantum technology: a review of current progress
Siyun Wang, Meimei Duan, Qing Yang Xu, Zigang Lu, Guofang Xia, Dan Gong, Yongxian Yi, Jin Bao
Abstract
The development of power system has put forward higher requirements for electrical metrology. However, the traditional measurement based on artefact has encountered a bottleneck due to its instability. In order to reduce the uncertainty of measurement, metrology based on quantum technology has been wildly studied. This paper introduces the principle of quantum voltage and two types of Josephson voltage standards, programmable Josephson voltage standards and AC Josephson voltage standards. The development and current progress of quantum voltage is introduced.