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Measurement Sensors

A dual beam photonic wavelength refernce

Matthew T. Hummon, Douglas G. Bopp, Jesse Kruse, Alexander Yulaev, Daron Westly, Kartik A. Srinivasan, Vladimir Aksyuk, John E. Kitching

Published Sep 28, 2021• 2 citations
Publisher

Abstract

We present operation of a photonically integrated wavelength reference at 780 nm using a dual beam geometry. The dual beams are generated by a pair of extreme mode converting grating beam expanders that generate a pair of overlapped, counter-propagating beams inside the volume of a microfabricated vapor cell. We perform spectroscopy of rubidium and a characterize the stability of laser locked to a sub-Doppler transition at 780 nm. By stabilizing the laser to a known transition in an atomic vapor, this device can serve as a quantum wavelength reference. The dual beam geometry also enables investigation of two-photon absorption in a three-level ladder configuration in rubidium using excitation at 780 nm + 776 nm.

DOI
10.1016/j.measen.2021.100288

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Journal of the Optical Society of America B•Nov 22, 2024•14 citations
We present operation of a photonically integrated wavelength reference at 780 nm using a dual beam geometry. The dual beams are generated by a pair of extreme mode converting grating beam expanders that generate a pair of overlapped, counter-propagating beams inside the volume of a microfabricated vapor cell. We perform spectroscopy of rubidium and a characterize the stability of laser locked to a sub-Doppler transition at 780 nm. By stabilizing the laser to a known transition in an atomic vapor, this device can serve as a quantum wavelength reference. The dual beam geometry also enables investigation of two-photon absorption in a three-level ladder configuration in rubidium using excitation at 780 nm + 776 nm.
Wavelength references in the telecom spectrum have applications in communications and dimensional metrology. However, they typically consist of bulk optics and vapor cells. Photonic integration of these components may lead to low cost, portable devices. Here we demonstrate the incorporation of a photonic Rb spectrometer with an AlN microresonator frequency doubler. Light at 1560 nm is coupled onto a chip containing the AlN microresonator frequency doubler. The resulting 780 nm light is sent to the photonic Rb spectrometer, which consists of an apodized grating beam expander and microfabricated MEMS vapor cell. We perform Doppler broadened spectroscopy of the D2 line and demonstrate preliminary laser stabilization to these features.
We demonstrate a dual wavelength optical frequency standard based on the dual optical transition modulation transfer spectroscopy (DOTMTS) between different quantum transitions of the rubidium D1 (795 nm) and D2 (780 nm) lines. In a single rubidium atomic ensemble, modulation frequency sidebands from the 780 nm pump beam are simultaneously transferred to both the 780 nm and 795 nm probe lasers. The DOTMTS enables the simultaneous stabilization of 780 nm and 795 nm lasers on a single vapor cell. Both lasers exhibit a frequency instability in the low 10 ^(-14) range at 1 s of averaging, as estimated from the residual error signal. A theoretical model is developed based on the V type atomic level structure to illustrate the dual-wavelength spectroscopy. This approach can be extended to develop a multiwavelength optical frequency standard within a single atomic ensemble, broadening its applicability in fields such as precision metrology, wavelength standards, optical networks, and beyond.
Devices based on spectroscopy of atomic vapors can measure physical quantities such as magnetic fields, RF electric fields, time and length, and rotation and have applications in a broad range of fields including communications, medicine, and navigation. We present a type of photonic device that interfaces single-mode silicon nitride optical waveguides with warm atomic vapors, enabling precision spectroscopy in an extremely compact (<1  cm3) package. We perform precision spectroscopy of rubidium confined in a micro-machined, 27  mm3 volume, vapor cell using a collimated free-space 120 μm diameter laser beam derived directly from a single-mode silicon nitride waveguide. With this optical-fiber integrated photonic spectrometer, we demonstrate an optical frequency reference at 780 nm with a stability of 10−11 from 1 to 104  s. This device harnesses the benefits of both photonic integration and precision spectroscopy for the next generation of quantum sensors and devices based on atomic vapors.
We demonstrate a dual-wavelength optical frequency standard based on the dual-optical-transition modulation transfer spectroscopy (DOT-MTS) between different quantum transitions of the rubidium D1 (795 nm) and D2 (780 nm) lines. In a single rubidium atomic ensemble, modulation frequency sidebands from the 780 nm pump beam are simultaneously transferred to both the 780 and 795 nm probe lasers. The DOT-MTS enables the simultaneous stabilization of 780 and 795 nm lasers on a single vapor cell. Both lasers exhibit a frequency instability in the low 10 −14 range at 1 s of averaging, as estimated from the residual error signal. A theoretical model is developed based on the V-type atomic level structure to illustrate the dual-wavelength spectroscopy. This approach can be extended to develop a multi-wavelength optical frequency standard within a single atomic ensemble, broadening its applicability in fields such as precision metrology, Rydberg atoms, wavelength standards, optical networks, and beyond.
We report on the development and short-term stability characterization of an optical frequency reference based on the spectroscopy of the rubidium two-photon transition at 778 nm in a microfabricated vapor cell. When compared against a 778 nm reference signal extracted from a frequency-doubled cavity-stabilized telecom laser, the short-term stability of the microcell frequency standard is 3.5 ×\times× 10−13^{-13}−13 τ−1/2τ^{-1/2}τ−1/2 until 200~s, in good agreement with a phase noise level of +++ 43 dBrad2^22/Hz at 1~Hz offset frequency. The two main contributions to the short-term stability of the microcell reference are currently the photon shot noise and the intermodulation effect induced by the laser frequency noise. With still a relevant margin of progress, these results show the interest of this spectroscopic approach for the demonstration of high-stability miniaturized optical vapor cell clocks. Such clocks are poised to be highly beneficial for applications in navigation, communications, and metrology.
We report on the development and short-term stability characterization of an optical frequency reference based on the spectroscopy of the rubidium two-photon transition at 778 nm in a microfabricated vapor cell. When compared against a 778 nm reference signal extracted from a frequency-doubled cavity-stabilized telecom laser, the short-term stability of the microcell frequency standard is 3.5×10−13τ−1/2 until 200 s, in good agreement with a phase noise level of +43dBrad2/Hz at 1 Hz offset frequency. The two main contributions to the short-term stability of the microcell reference are currently the photon shot noise and the intermodulation effect induced by the laser frequency noise. Retaining a relevant margin of progress, these results show the interest of this spectroscopic approach for the demonstration of high-stability miniaturized optical vapor cell clocks. Such clocks are poised to be highly beneficial for applications in navigation, communications, and metrology.