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The Japan Society of Applied Physics

Ultra-low optical bistability onset in high- Q buried-heterostructure L3 nanocavity

Eiichi Kuramochi

Published Jul 4, 2013• 0 citations
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nW-class optical memory operation at buried-heterostructure L3 nanocavity

Eiichi Kuramochi

The Japan Society of Applied Physics•Feb 6, 2014•0 citations

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Buried-Heterostructure L3 Nanocavity All-Optical Memory with 2.3-nW Power Consumption

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A tuned L3 design with an enhanced Q factor and a small mode volume enabled 2.3-nW bias power for a buried-heterostructure InGaAsP/InP nanocavity optical memory that was 1/10 of the previous record (30 nW).

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Ultralow bias power all-optical photonic crystal memory realized with systematically tuned L3 nanocavity

Eiichi Kuramochi, Kengo Nozaki, Akihiko Shinya +5 more

An InP photonic crystal nanocavity with an embedded InGaAsP active region is a unique technology that has realized an all-optical memory with a sub-micro-watt operating power and limitless storage time. In this study, we employed an L3 design with systematic multi-hole tuning, which realized a higher loaded Q factor (>40 000) and a lower mode volume (0.9 μm3) than a line-defect-based buried-heterostructure nanocavity (16 000 and 2.2 μm3). Excluding the active region realized a record loaded Q factor (210 000) in all for InP-based nanocavities. The minimum bias power for bistable memory operation was reduced to 2.3 ± 0.3 nW, which is about 1/10 of the previous record of 30 nW. This work further established the capability of a bistable nanocavity memory for use in future ultralow-power-consumption on-chip integrated photonics.

Applied Physics Letters•Nov 30, 2015•14 citations
An InP photonic crystal nanocavity with an embedded InGaAsP active region is a unique technology that has realized an all-optical memory with a sub-micro-watt operating power and limitless storage time. In this study, we employed an L3 design with systematic multi-hole tuning, which realized a higher loaded Q factor (>40 000) and a lower mode volume (0.9 μm3) than a line-defect-based buried-heterostructure nanocavity (16 000 and 2.2 μm3). Excluding the active region realized a record loaded Q factor (210 000) in all for InP-based nanocavities. The minimum bias power for bistable memory operation was reduced to 2.3 ± 0.3 nW, which is about 1/10 of the previous record of 30 nW. This work further established the capability of a bistable nanocavity memory for use in future ultralow-power-consumption on-chip integrated photonics.