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Journal of Quantitative Spectroscopy and Radiative Transfer

Backward fluorescence of optically thick Cs vapor: Experiment and Monte-Carlo simulations

J. C. de Aquino Carvalho, Thierry Passerat de Silans

Published Dec 9, 2020• 5 citations
Publisher
DOI
10.1016/j.jqsrt.2020.107469

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The high resolution spectroscopy of nanometric alkali-vapor layers has been made possible through the development of extremely thin cell.We present a detailed comparison of the fluorescence profiles amplitude and width, obtained in the extremely thin cell, both theoretically and experimentally.Experiments are performed on the D 2 line of Cs-vapor layer with thickness L = mλ, where m = 0.5, 0.75, 1, 1.25.The enhancement rate of the transition profiles width is not growing monotonously, but it is larger for L varying in the interval from L = 0.75λ to L = λ than that varying in the interval from L = λ to L = 1.25λ.The used theoretical model, based on the optical Bloch equations is in qualitative agreement with the experimental observations.
Literature mentions only incidentally a sub-Doppler contribution in the excitation spectrum of the backward fluorescence of a dense vapor. This contribution is here investigated on Cs vapor, both on the first resonance line (894 nm) and on the weaker second resonance line (459 nm). We show that in a strongly absorbing medium, the quenching of excited atoms moving towards a window irradiated under near normal incidence reduces the fluorescence on the red side of the excitation spectrum. Atoms moving slowly towards the window produce a sub-Doppler velocity-selective contribution, whose visibility is here improved by applying a frequency-modulation technique. This sub-Doppler feature, induced by a surface quenching combined with a short absorption length for the incident irradiation, exhibits close analogies with the narrow spectra appearing with thin vapor cells. We also show that a normal incidence irradiation is essential for the sub-Doppler feature to be observed, while it should be independent of the detection geometry.