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Quantum Metrology with Photoelectrons: Vol 2

Paul Hockett

Published Apr 4, 2018• 0 citations
OpenAlex

Abstract

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Volume 2, Quantum Metrology with Photoelectrons: Applications and advances discusses the fundamental concepts along with recent and emerging applications.  Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on complete photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including

Related papers

Quantum Metrology with Photoelectrons, Volume 2

Paul Hockett

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Morgan & Claypool Publishers eBooks•Apr 1, 2018•3 citations

Quantum Metrology with Photoelectrons, Volume 1

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Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

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Introduction: concepts in photoionization interferometry

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The overarching theme of this book is the measurement and application of photoelectron interferograms; more specifically, the real thrust is the development of the quantitative analysis of such interferograms in order to build techniques and methodologies for a full quantum metrology based on this class of measurement. In this chapter, some of the basic concepts are discussed generally, historically and philosophically, before more technical material is introduced in chapter 2.

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Introduction

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There are two core topics at the heart of this series, specifically photoelectron spectroscopy (and associated experimental, theoretical and analysis methodologies) and quantum metrology in general. These are briefly introduced in this chapter, in the context of developing generalised quantitative analysis protocols making use of phase-sensitive observables (photoelectron interferograms), i.e. quantum metrology with photoelectrons. The general aims and context for volume 3 are also outlined, including a brief summary of the open-source computational methods used, the structure of the book, and methods to obtain the book source code.

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Towards quantum-enhanced precision measurements: Promise and challenges

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Quantum metrology holds the promise of improving the measurement precision beyond the limit of classical approaches. To achieve such enhancement in performance requires the development of quantum estimation theories as well as novel experimental techniques. In this article, we provide a brief review of some recent results in the field of quantum metrology. We emphasize that the unambiguous demonstration of the quantum-enhanced precision needs a careful analysis of the resources involved. In particular, the implementation of quantum metrology in practice requires us to take into account the experimental imperfections included, for example, particle loss and dephasing noise. For a detailed introduction to the experimental demonstrations of quantum metrology, we refer the reader to another article ‘Quantum metrology’ in the same issue.

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Quantum Mechanics II: Advanced Topics

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Quantum Mechanics II: Advanced Topics uses more than a decade of research and the authors’ own teaching experience to expound on some of the more advanced topics and current research in quantum mechanics. A follow-up to the authors introductory book Quantum Mechanics I: The Fundamentals, this book begins with a chapter on quantum field theory, and goes on to present basic principles, key features, and applications. It outlines recent quantum technologies and phenomena, and introduces growing topics of interest in quantum mechanics. The authors describe promising applications that include ghost imaging, detection of weak amplitude objects, entangled two-photon microscopy, detection of small displacements, lithography, metrology, and teleportation of optical images. They also present worked-out examples and provide numerous problems at the end of each chapter.

•Dec 10, 2014•1 citation
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Volume 2, Quantum Metrology with Photoelectrons: Applications and advances discusses the fundamental concepts along with recent and emerging applications.  Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on complete photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
There are two core topics at the heart of this series, specifically photoelectron spectroscopy (and associated experimental, theoretical and analysis methodologies) and quantum metrology in general. These are briefly introduced in this chapter, in the context of developing generalised quantitative analysis protocols making use of phase-sensitive observables (photoelectron interferograms), i.e. quantum metrology with photoelectrons. The general aims and context for volume 3 are also outlined, including a brief summary of the open-source computational methods used, the structure of the book, and methods to obtain the book source code.
Quantum metrology holds the promise of improving the measurement precision beyond the limit of classical approaches. To achieve such enhancement in performance requires the development of quantum estimation theories as well as novel experimental techniques. In this article, we provide a brief review of some recent results in the field of quantum metrology. We emphasize that the unambiguous demonstration of the quantum-enhanced precision needs a careful analysis of the resources involved. In particular, the implementation of quantum metrology in practice requires us to take into account the experimental imperfections included, for example, particle loss and dephasing noise. For a detailed introduction to the experimental demonstrations of quantum metrology, we refer the reader to another article ‘Quantum metrology’ in the same issue.
Quantum Mechanics II: Advanced Topics uses more than a decade of research and the authors’ own teaching experience to expound on some of the more advanced topics and current research in quantum mechanics. A follow-up to the authors introductory book Quantum Mechanics I: The Fundamentals, this book begins with a chapter on quantum field theory, and goes on to present basic principles, key features, and applications. It outlines recent quantum technologies and phenomena, and introduces growing topics of interest in quantum mechanics. The authors describe promising applications that include ghost imaging, detection of weak amplitude objects, entangled two-photon microscopy, detection of small displacements, lithography, metrology, and teleportation of optical images. They also present worked-out examples and provide numerous problems at the end of each chapter.