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Morgan & Claypool Publishers eBooks

Introduction: concepts in photoionization interferometry

Paul Hockett

Published Apr 1, 2018• 0 citations
Publisher

Abstract

The overarching theme of this book is the measurement and application of photoelectron interferograms; more specifically, the real thrust is the development of the quantitative analysis of such interferograms in order to build techniques and methodologies for a full quantum metrology based on this class of measurement. In this chapter, some of the basic concepts are discussed generally, historically and philosophically, before more technical material is introduced in chapter 2.

DOI
10.1088/978-1-6817-4684-5ch1

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The overarching theme of this book is the measurement and application of photoelectron interferograms; more specifically, the real thrust is the development of the quantitative analysis of such interferograms in order to build techniques and methodologies for a full quantum metrology based on this class of measurement. In this chapter, some of the basic concepts are discussed generally, historically and philosophically, before more technical material is introduced in chapter 2.
There are two core topics at the heart of this series, specifically photoelectron spectroscopy (and associated experimental, theoretical and analysis methodologies) and quantum metrology in general. These are briefly introduced in this chapter, in the context of developing generalised quantitative analysis protocols making use of phase-sensitive observables (photoelectron interferograms), i.e. quantum metrology with photoelectrons. The general aims and context for volume 3 are also outlined, including a brief summary of the open-source computational methods used, the structure of the book, and methods to obtain the book source code.
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Volume 2, Quantum Metrology with Photoelectrons: Applications and advances discusses the fundamental concepts along with recent and emerging applications.  Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on complete photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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The field of quantum optics has witnessed significant theoretical and experimental developments in recent years. This book provides an in-depth and wide-ranging introduction to the subject, emphasising throughout the basic principles and their applications. The book begins by developing the basic tools of quantum optics, and goes on to show the application of these tools in a variety of quantum optical systems, including lasing without inversion, squeezed states and atom optics. The final four chapters are devoted to a discussion of quantum optical tests of the foundations of quantum mechanics, and to particular aspects of measurement theory. Assuming only a background of standard quantum mechanics and electromagnetic theory, and containing many problems and references, this book will be invaluable to graduate students of quantum optics, as well as to researchers in this field.