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Acta Sinica Quantum Optica

Atomic-based Microwave Field Measurement

金明明 JIN Ming-ming, 张瑞国 ZHANG Rui-guo, 高红卫 GAO Hong-wei, 李贵兰 LI Gui-lan, 寇军 Kou Jun

Published Jan 1, 2020• 0 citations
Publisher
DOI
10.3788/jqo20202601.1001

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Atomic microwave technology is a promising platform for quantum precision measurement and quantum information processing. However, experimental progress to date has been limited by microwave reflection interference in free space and the difficulty of temperature control. We report the development of high precision atomic microwave magnetic field measurement in standard microwave waveguides. Enabled by a reduction in reflected microwave interference and temperature frequency shift, our approach yields a significant improvement in microwave magnetic field measurement. We further show that the relationship between Rabi resonance profile and laser intensity, atomic vapor cell temperature and microwave intensity measured in microwave waveguide is confirmed to be accurate and reliable. These advances open up new prospects for quantum precision measurement and quantum sensing with alkali atoms.