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APS

Free-Induction Decay and Dynamic Spectral Hole Burning in Rb Vapor

Krishna Myneni, Michael E. Crenshaw, Shawn D. Pethel

Published May 1, 2004• 0 citations
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Transient hole-burning and free induction decay (FID) in low-temperature ion-doped crystals are studied consistently using the model of two jump processes Ut equals Ut1 + Ut2 characterized by essentially different jump rates v1 >> v2 and distribution widths (sigma) 1 << (sigma) 2 for the impurity ion optical transition frequency fluctuations Ut due to the bulk and the frozen core spin flipping. At short pump/probe pulsewidth T and short delay time (tau) d ((tau) d, T << v2-1) the calculated hole shape is narrow with the hole width determined by Ut1 process characteristics only. The hole width in this case coincides with the calculated FID rate. At long delay (tau) d >= v2-1 the hole becomes a wide lorentzian with the halfwidth 2(sigma) 2. The theory fits well the experimental data by A. Szabo et. al. on narrow hole burning and FID in ruby under low and high magnetic fields supposing the fluctuations Ut1 to be rather slow ((sigma) 21/v21 equals 0.5).

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Summary form only given. The magnetic grating free induction decay (MGFID) may be produced in a sample of room temperature (300 K) /sup 35/Rb, demonstrating the coherence between alternate magnetic sublevels. The decay rate of this coherence is dominated by the dispersal of the atoms and proportional to the most probable velocity u of the atoms. By slowing and confining the atoms in a magnetooptic trap, the decay rate may be reduced by several orders of magnitude.

Quantum Electronics and Laser Science Conference•Jun 2, 1996•0 citations
Transient hole-burning and free induction decay (FID) in low-temperature ion-doped crystals are studied consistently using the model of two jump processes Ut equals Ut1 + Ut2 characterized by essentially different jump rates v1 >> v2 and distribution widths (sigma) 1 << (sigma) 2 for the impurity ion optical transition frequency fluctuations Ut due to the bulk and the frozen core spin flipping. At short pump/probe pulsewidth T and short delay time (tau) d ((tau) d, T << v2-1) the calculated hole shape is narrow with the hole width determined by Ut1 process characteristics only. The hole width in this case coincides with the calculated FID rate. At long delay (tau) d >= v2-1 the hole becomes a wide lorentzian with the halfwidth 2(sigma) 2. The theory fits well the experimental data by A. Szabo et. al. on narrow hole burning and FID in ruby under low and high magnetic fields supposing the fluctuations Ut1 to be rather slow ((sigma) 21/v21 equals 0.5).
Steady-state free induction decay (FID), hole burning (HB) and transient nutations (TN) decay are investigated in ensemble of two-level particles with inhomogeneously broadened spectrum. The influence of x- and y-noise components induced by the coherent field exciting the resonant transition is considered. It is shown that 'longitudinal' (x) and 'transverse' (y) noises give the contribution to both T1 and T2 relaxation processes. This effect accelerates TN decay and changes the saturation broadening seen in HB and FID. It is found that when field-noise contributions to 1/T2 and 1/T1 relaxation rates are dominant and equal to each other, the Bloch's saturation is changed to Redfield's saturation. Comparison with experimentally observed FID and TN in nearly ideal spin system (color centers in quartz and silica) is discussed.