Measurements of the 1/f Noise in Josephson Junctions for Potential Use as QUbits

Michael Mück, Matthias Korn, Chas Mugford +2 more

Critical current fluctuations with a 1∕f spectral density (f is frequency) are potentially a limiting source of intrinsic decoherence in superconducting quantum bits (qubits) based on Josephson tunnel junctions. Prior measurements of this noise were made at nonzero voltages whereas qubits are operated in the zero voltage state. We report measurements of 1∕f noise in a dc superconducting quantum interference device first, coupled to a resonant tank circuit and operated in a dispersive mode at zero voltage, and, second, operated conventionally with a current bias in the voltage regime. Both measurements yield essentially the same magnitude of critical current 1∕f noise.

R. McDermott, Radek Bialczak, M. Ansmann +8 more

Almog Reshef, Maytal Caspary Toroker

Abstract Flicker noise causes decoherence in Josephson junction-based superconducting qubits, thus limiting their practical potential as building blocks for quantum computers. This is due to limited length and complexity of executable algorithms, and increased dependency on error-correcting measures. Therefore, identifying and subsiding the atomic sources of flicker noise are of great importance to the development of this technology. We developed a method that combines ab initio DFT calculations and quantum dynamics to model charge transport across a Josephson junction, by which it is possible to more accurately assess different defects as sources of flicker noise. We demonstrate the use of our method in an investigation of various atomic defects, including vacancies, trapping, and substitutions, in an Al|Al2O3|Al Josephson junction. This demonstration both reveals weaknesses in previous attempts to pinpoint the atomic sources of flicker noise and highlights new candidates.

Alexander Shnirman, Gerd Schön, Ivar Martin +1 more

Elisabetta Paladino, Lara Faoro, G. Falci +1 more

Margaret Fortman, Harrison, David C., Ramiro H. Rodriguez +6 more

Josephson junction spectroscopy is a powerful local microwave spectroscopy technique that has promising potential as a diagnostic tool to probe the microscopic origins of noise in superconducting qubits. We present advancements toward realizing Josephson junction spectroscopy in a scanning geometry, where the Josephson junction is formed between a superconducting sample and a high capacitance superconducting STM tip. Data from planar Nb-based Josephson junction devices first demonstrate the benefits of including a high capacitance shunt across the junction, which decreases linewidth and improves performance at elevated temperatures. We show how an equivalent circuit can be implemented by utilizing a planarized STM tip with local prominences, which are fabricated via electron beam lithography and reactive ion etching, followed by coating with a superconducting layer. Differential conductance measurements on a superconducting NbN surface demonstrate the ability of these high capacitance tips to decrease both thermal noise and P(E)-broadening in comparison to typical wire tips.