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APS

Microwave-induced escape of a Josephson vortex from a potential well

Alexey Vladimirovich Ustinov, Andreas J. Wallraff, C. Coqui, T. Duty, Alexander V. Lukashenko, M. V. Fistul

Published Mar 1, 2002• 0 citations
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We present a study of phase escape in surface Bi 2 Sr 2 CaCu 2 O 8+ δ intrinsic Josephson junctions in the presence of microwave radiation. The measured switching current distributions display clear double-peak structures in the microwave field, which result from the single- and two-photon resonant escape processes accompanied by microwave-induced potential barrier suppression. We show that these results can be well explained by a quantum-mechanical model proposed by Fistul et al (2003 Phys. Rev. B 68 060504), from which the power and frequency dependences of the switching current distributions can be reproduced.