New Journal of Physics
Resonant phase escape in Bi2Sr2CaCu2O8+δsurface intrinsic Josephson junctions
Haifeng Yu, Xiaobo Zhu, Jian-kun Ren, Zhihui Peng, D. J. Cui, Hui Deng, W H Cao, Ye Tian, G H Chen, Dongning Zheng, X.N. Jing, Li Lü, S. P. Zhao
Abstract
We present a study of phase escape in surface Bi 2 Sr 2 CaCu 2 O 8+ δ intrinsic Josephson junctions in the presence of microwave radiation. The measured switching current distributions display clear double-peak structures in the microwave field, which result from the single- and two-photon resonant escape processes accompanied by microwave-induced potential barrier suppression. We show that these results can be well explained by a quantum-mechanical model proposed by Fistul et al (2003 Phys. Rev. B 68 060504), from which the power and frequency dependences of the switching current distributions can be reproduced.