Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Log inSign up
Challenges
Datasets
Workspaces
Papers
Discussions
Leaderboard
Blog
Job Board
Q3AS

© 2026 Aqora Quantum S.A.S.

TermsPrivacyLegal Notice

Bulletin of the American Physical Society

Electric-field noise from thermally-activated fluctuators in a surface ion trap

Maya Berlin-Udi, Crystal Noel, Clemens Matthiesen, Vincenzo Lordi, Hartmut Häffner

Published Mar 5, 2019• 0 citations
OpenAlex

Related papers

Electric field noise in surface ion traps

Crystal Noel, Maya Lewin-Berlin, Clemens Matthiesen +2 more

Bulletin of the American Physical Society•Mar 16, 2017•0 citations

Measurements of electric field noise and light-induced charging in cryogenic surface electrode ion traps

Nathan S. Lachenmyer

•Jan 1, 2010•0 citations

Electric-field noise from thermally activated fluctuators in a surface ion trap

Crystal Noel, Maya Berlin-Udi, Clemens Matthiesen +4 more

We probe electric-field noise near the metal surface of an ion-trap chip in the temperature range from 295 to 530 K. We observe a nontrivial temperature dependence with the noise amplitude at 1 MHz frequency saturating around 500 K. Measurements of the noise spectrum reveal a $1/{f}^{\ensuremath{\alpha}\ensuremath{\approx}1}$ dependence and a small decrease in $\ensuremath{\alpha}$ between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally activated two-level fluctuators with activation energies between 0.35 and 0.65 eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example, defect motion in the solid state and surface adsorbate binding energies. The study of these processes may aid in identification of the origin of excess electric-field noise in ion traps---a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.

arXiv:1809.05624•Physical Review A•Jun 26, 2019•41 citations

High temperature studies of electric-field noise in a surface ion trap

Crystal Noel

Electric-field noise is a major limiting factor in the performance of ion traps and other quantum devices. Despite intensive research over the past decade, the nature and cause of electric field noise near surfaces is not well understood. This dissertation reports the high- temperature dependence of electric-field noise above an Al-Cu surface using a trapped 40Ca+ ion as a probe.We employ a novel setup with a surface ion trap mounted on a heater for studies of the temperature dependence of electric-field noise. To characterize the Al-Cu material, we explore the effects of heat treatment through ex situ annealing followed by inspection in a scanning electron microscope. To calibrate the temperature of the trap, we demonstrate the use of thermal imaging for monitoring the temperature of an ion trap in vacuum.The temperature and frequency dependence of electric-field noise above the surface is measured using the heating rate of a single ion in a surface-electrode Paul trap. We find that the heating rate saturates at temperatures greater than 450 K. We find that the frequency dependence shows a 1/f behavior, and has a lower frequency scaling exponent at high temperatures than at room temperature. We show that these results are a reflection of the surface-related noise by eliminating other possible sources of noise.Building on historical data for resistance fluctuations in thin films, we develop the thermally-activated fluctuator model to describe the results. We find that a broad distribution of fluctuators with energy barriers peaked around 0.5 eV accurately models both the temperature and frequency dependence of the electric-field noise measured. We present the interpretation of this model as a way to infer that the cause of electric-field noise in the trap is likely defect motion in the metal surface, connecting the problems faced in ion trapping to a large body of work in solid state physics.

•Jan 1, 2019•0 citations

A complicated Duffing oscillator in the surface-electrode ion trap

Hao-Yu Wu, Yi Xie, Wei Wan +3 more

arXiv:1302.3923•Applied Physics B•Jun 21, 2013•6 citations

Characteristics of electrical field in surface-electrode ion traps

周晓煜, 徐高平

•Mar 8, 2012•0 citations
We probe electric-field noise near the metal surface of an ion-trap chip in the temperature range from 295 to 530 K. We observe a nontrivial temperature dependence with the noise amplitude at 1 MHz frequency saturating around 500 K. Measurements of the noise spectrum reveal a $1/{f}^{\ensuremath{\alpha}\ensuremath{\approx}1}$ dependence and a small decrease in $\ensuremath{\alpha}$ between low and high temperatures. This behavior can be explained by considering noise from a distribution of thermally activated two-level fluctuators with activation energies between 0.35 and 0.65 eV. Processes in this energy range may be relevant to understanding electric-field noise in ion traps; for example, defect motion in the solid state and surface adsorbate binding energies. The study of these processes may aid in identification of the origin of excess electric-field noise in ion traps---a major source of ion motional decoherence limiting the performance of surface traps as quantum devices.
Electric-field noise is a major limiting factor in the performance of ion traps and other quantum devices. Despite intensive research over the past decade, the nature and cause of electric field noise near surfaces is not well understood. This dissertation reports the high- temperature dependence of electric-field noise above an Al-Cu surface using a trapped 40Ca+ ion as a probe.We employ a novel setup with a surface ion trap mounted on a heater for studies of the temperature dependence of electric-field noise. To characterize the Al-Cu material, we explore the effects of heat treatment through ex situ annealing followed by inspection in a scanning electron microscope. To calibrate the temperature of the trap, we demonstrate the use of thermal imaging for monitoring the temperature of an ion trap in vacuum.The temperature and frequency dependence of electric-field noise above the surface is measured using the heating rate of a single ion in a surface-electrode Paul trap. We find that the heating rate saturates at temperatures greater than 450 K. We find that the frequency dependence shows a 1/f behavior, and has a lower frequency scaling exponent at high temperatures than at room temperature. We show that these results are a reflection of the surface-related noise by eliminating other possible sources of noise.Building on historical data for resistance fluctuations in thin films, we develop the thermally-activated fluctuator model to describe the results. We find that a broad distribution of fluctuators with energy barriers peaked around 0.5 eV accurately models both the temperature and frequency dependence of the electric-field noise measured. We present the interpretation of this model as a way to infer that the cause of electric-field noise in the trap is likely defect motion in the metal surface, connecting the problems faced in ion trapping to a large body of work in solid state physics.