We report room-temperature electric field noise measurements combined with in-situ surface characterization and cleaning of a microfabricated ion trap. We used a single-ion electric field noise sensor in combination with surface cleaning and analysis tools, to investigate the relationship between electric field noise from metal surfaces in vacuum and the composition of the surface. These experiments were performed in a novel setup that integrates ion trapping capabilities with surface analysis tools. We find that surface cleaning of an aluminum-copper surface significantly reduces the level of electric field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The post-cleaning noise levels are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap.We report room-temperature electric field noise measurements combined with in-situ surface characterization and cleaning of a microfabricated ion trap. We used a single-ion electric field noise sensor in combination with surface cleaning and analysis tools, to investigate the relationship between electric field noise from metal surfaces in vacuum and the composition of the surface. These experiments were performed in a novel setup that integrates ion trapping capabilities with surface analysis tools. We find that surface cleaning of an aluminum-copper surface significantly reduces the level of electric field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The post-cleaning noise levels are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap.

arXiv:1307.7194Jul 26, 20131 citation

Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Kyle S. McKay, Dustin A. Hite, Philip D. Kent +5 more

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

arXiv:2102.00965Physical Review ANov 18, 20218 citations

Distance scaling and polarization of electric-field noise in a surface ion trap

Da An, Clemens Matthiesen, Erik Urban +1 more

We probe electric-field noise in a surface ion trap for ion-surface distances $d$ between 50 and 300 \textmu{}m in the normal and planar directions. We find the noise distance dependence to scale as ${d}^{\ensuremath{-}2.6}$ in our trap and a frequency dependence which is consistent with $1/f$ noise. Simulations of the electric-field noise specific to our trap geometry provide evidence that we are not limited by technical noise sources. Our distance scaling data is consistent with a noise correlation length of about 100 \textmu{}m at the trap surface, and we discuss how patch potentials of this size would be modified by the electrode geometry.We probe electric-field noise in a surface ion trap for ion-surface distances $d$ between 50 and 300 \textmu{}m in the normal and planar directions. We find the noise distance dependence to scale as ${d}^{\ensuremath{-}2.6}$ in our trap and a frequency dependence which is consistent with $1/f$ noise. Simulations of the electric-field noise specific to our trap geometry provide evidence that we are not limited by technical noise sources. Our distance scaling data is consistent with a noise correlation length of about 100 \textmu{}m at the trap surface, and we discuss how patch potentials of this size would be modified by the electrode geometry.

arXiv:1906.06489Physical Review ADec 3, 201917 citations

We probe electric-field noise in a surface ion trap for ion-surface distances

d

between 50 and 300 \textmu{}m in the normal and planar directions. We find the noise distance dependence to scale as ${d}^{\ensuremath{-}2.6}$ in our trap and a frequency dependence which is consistent with

1/f

noise. Simulations of the electric-field noise specific to our trap geometry provide evidence that we are not limited by technical noise sources. Our distance scaling data is consistent with a noise correlation length of about 100 \textmu{}m at the trap surface, and we discuss how patch potentials of this size would be modified by the electrode geometry.