International Conference on Solid State Devices and Materials (SSDM)

Population trapping through spectral hole burning in 167Er3+:Y2SiO5

Mark IJspeert, Giacomo Mariani, Takehiko Tawara, K Shimizu, Hiroo Omi, S. Adachi, Hideki Gotoh

Published Sep 21, 2017• 0 citations

DOI: 10.7567/ssdm.2017.g-3-06

Related papers

Investigations of population relaxation properties of hyperfine sublevels in 167Er3+ ions doped in a Y2SiO5 crystal

Daisuke Hashimoto, Kaoru Shimizu

We have established the lifetime t1of the hyperfine sublevels of167Er3+ions in Y2SiO5using spectral hole burning, measuring it as 37.8 + 8.9 ms at 2.25 K. Its temperature dependence varies as (1/T)n(n ~ 3).

Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)Jun 1, 20130 citations

Population Trapping in Excited States

Harm Geert Muller, M. P. de Boer

NATO ASI series. Series B : PhysicsJan 1, 19930 citations

Spectral Hole Narrowing in Er3+ 4f Transitions by Isotope Separation

Takehiko Tawara, Giacomo Mariani, Kaoru Shimizu +3 more

We report effect of isotope separation on the homogeneous linewidth in Er3+-doped Y2SiO5 measured by using spectral hole burning. Isotope 167Er3+ provides a drastic reduction of the spectral hole width by strongly suppressing instantaneous spectral diffusion.

Conference on Lasers and Electro-OpticsJan 1, 20170 citations

V Coherent Population Trapping in Laser Spectroscopy

E. Arimondo

Progress in opticsJan 1, 19961,158 citations

Spectral holeburning by population storage in metastable zeeman and optical sublevels of the Nd3+ ion

R. M. Macfarlane, J. C. Vial

Journal of LuminescenceFeb 1, 19883 citations

Electromagnetically Induced Transparency in rare-earth 167Er3+-doped Y2SiO5 crystal

E. Baldit, S. Briaudeau, P. Monnier +2 more

We report on the observation of electromagnetically induced transparency using the hyperfine levels of Er3+:Y2SiO5crystal and on hole burning spectroscopy in order to identify the Lambda-like three-level system over the inhomogeneously broadened distribution.

Conference on Lasers and Electro-OpticsJan 1, 20060 citations