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Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)

Investigations of population relaxation properties of hyperfine sublevels in 167Er3+ ions doped in a Y2SiO5 crystal

Daisuke Hashimoto, Kaoru Shimizu

Published Jun 1, 2013• 0 citations
Publisher

Abstract

We have established the lifetime t1of the hyperfine sublevels of167Er3+ions in Y2SiO5using spectral hole burning, measuring it as 37.8 + 8.9 ms at 2.25 K. Its temperature dependence varies as (1/T)n(n ~ 3).
DOI
10.1109/cleopr.2013.6599946

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We demonstrate transient saturation spectroscopy for 167Er3+ ions doped in a silicate glass fiber cooled at 2.5–30 K to measure the population relaxation time t1 of the hyperfine sublevels. The observed t1 value is 3.1 ms at 4 K and we observe anomalous temperature dependence whereby t1 becomes rather longer with heating from 4 to 30 K. We can regard the population relaxation as a result of the Raman scattering of the Boson peak mode (BPM) peculiar to a silicate glass by the 4f-electrons of the 167Er3+ ions. We can attribute the anomalous temperature dependence to the suppression of the Raman scattering by thermal hopping of the localized BPM.
We have been investigating hyperfine sublevels of 67 Er 3+ ions doped in a silicate glass fiber with the objective of demonstrating quantum memory in the .5-µmtelecommunication band.Memory time is determined by the stability of hyperfine sublevels (the lifetime) of 67 Er 3+ ions, so it is therefore necessary to clarify the lifetime properties.This article describes (i) the anomalous temperature dependence of the lifetime that was unexpectedly discovered in the lifetime measurements and (ii) the physical properties of glass that resulted in the anomalous phenomenon.