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Indium Thin Films in Multilayer Superconducting Quantum Circuits

Corey Rae McRae

Published Jan 3, 2018• 0 citations
OpenAlex

Abstract

The superconducting quantum computer is an implementation of the quantum computer and a current leader the field in terms of performance and potential for scalability to large systems. Its two main components are the superconducting microwave resonator and the quantum bit (qubit). In Chapter 1, the concept of quantum computing is introduced, and the superconducting microwave resonator is explained in depth, along with a glimpse at the qubit and a description of two level system loss, the most prominent form of loss in low-power superconducting quantum circuits. Scalability is essential to the development of fault-tolerant quantum computing, as error correction requires a large array of quantum bits. The multilayer quantum circuit architecture is rising to the forefront as a solution to many of the scalability issues facing the field today. Chapter 2 summarizes some of these scalability issues, such as the suppression of unwanted modes and materials losses, and presents an overview of multilayer architectures applied to superconducting quantum circuits. The chapter further delves into indium bump bonding, an essential technique in multilayer circuit fabrication.In Chapter 3, we experimentally demonstrate a thermocompression bonding technology between on-chip indium thin films and apply it to capped superconducting devices. These devices can be used as a building block towards a more scalable architecture: the multilayer quantum circuit. We characterize the dc and microwave performance of these bonded devices at room temperature as well as cryogenic temperatures. At 10 mK, we find a small but significant dc bond resistance of 49.2μΩ cm2. A tunnel-capped, bonded device shows minimal microwave reflections and clean transmission up to 6.8 GHz compared to a similar uncapped device, demonstrating good performance. As a proof of concept, we fabricate and measure a set of tunnel-capped superconducting resonators, demonstrating marginal deterioration in resonator performance due to the bonding procedure. This work demonstrates that thermocompression bonding between thin on-chip indium films is a useful addition to the multilayer quantum circuit toolbox, and that this technique, when applied to form the tunnel-capped superconducting device, shows a promising step towards more scalable architectures. Indium is becoming ubiquitous in superconducting microwave circuits as it continues to be widely adopted as a bonding medium. However, the loss mechanisms in superconducting indium films have not been examined until now. In Chapter 4, we characterize microwave loss in indium and aluminium/indium thin films on silicon substrates by measuring superconducting coplanar waveguide resonators and estimating the main loss parameters at powers down to the sub-photon regime and at temperatures between 10 and 450 mK. We compare films deposited by thermal evaporation, sputtering, and molecular beam epitaxy. We study the effects of heating in vacuum and ambient atmospheric pressure as well as the effects of pre-deposition wafer cleaning using hydrofluoric acid. The microwave measurements are supported by thin film metrology including secondary-ion mass spectrometry. For thermally evaporated and sputtered films, we find that two-level states (TLSs) are the dominating loss mechanism at low photon number and temperature. Thermally evaporated indium is determined to have a TLS loss tangent due to indium oxide of∼5×10−5. The molecular beam epitaxial films show evidence of formation of a substantial indium-silicon eutectic layer, which leads to a drastic degradation in resonator performance.

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The superconducting quantum computer is an implementation of the quantum computer and a current leader the field in terms of performance and potential for scalability to large systems. Its two main components are the superconducting microwave resonator and the quantum bit (qubit). In Chapter 1, the concept of quantum computing is introduced, and the superconducting microwave resonator is explained in depth, along with a glimpse at the qubit and a description of two level system loss, the most prominent form of loss in low-power superconducting quantum circuits. Scalability is essential to the development of fault-tolerant quantum computing, as error correction requires a large array of quantum bits. The multilayer quantum circuit architecture is rising to the forefront as a solution to many of the scalability issues facing the field today. Chapter 2 summarizes some of these scalability issues, such as the suppression of unwanted modes and materials losses, and presents an overview of multilayer architectures applied to superconducting quantum circuits. The chapter further delves into indium bump bonding, an essential technique in multilayer circuit fabrication.In Chapter 3, we experimentally demonstrate a thermocompression bonding technology between on-chip indium thin films and apply it to capped superconducting devices. These devices can be used as a building block towards a more scalable architecture: the multilayer quantum circuit. We characterize the dc and microwave performance of these bonded devices at room temperature as well as cryogenic temperatures. At 10 mK, we find a small but significant dc bond resistance of 49.2μΩ cm2. A tunnel-capped, bonded device shows minimal microwave reflections and clean transmission up to 6.8 GHz compared to a similar uncapped device, demonstrating good performance. As a proof of concept, we fabricate and measure a set of tunnel-capped superconducting resonators, demonstrating marginal deterioration in resonator performance due to the bonding procedure. This work demonstrates that thermocompression bonding between thin on-chip indium films is a useful addition to the multilayer quantum circuit toolbox, and that this technique, when applied to form the tunnel-capped superconducting device, shows a promising step towards more scalable architectures. Indium is becoming ubiquitous in superconducting microwave circuits as it continues to be widely adopted as a bonding medium. However, the loss mechanisms in superconducting indium films have not been examined until now. In Chapter 4, we characterize microwave loss in indium and aluminium/indium thin films on silicon substrates by measuring superconducting coplanar waveguide resonators and estimating the main loss parameters at powers down to the sub-photon regime and at temperatures between 10 and 450 mK. We compare films deposited by thermal evaporation, sputtering, and molecular beam epitaxy. We study the effects of heating in vacuum and ambient atmospheric pressure as well as the effects of pre-deposition wafer cleaning using hydrofluoric acid. The microwave measurements are supported by thin film metrology including secondary-ion mass spectrometry. For thermally evaporated and sputtered films, we find that two-level states (TLSs) are the dominating loss mechanism at low photon number and temperature. Thermally evaporated indium is determined to have a TLS loss tangent due to indium oxide of∼5×10−5. The molecular beam epitaxial films show evidence of formation of a substantial indium-silicon eutectic layer, which leads to a drastic degradation in resonator performance.
Extensible quantum computing architectures require a large array of quantum bits operating with low error rates. A quantum processor based on superconducting devices can be scaled up by stacking microchips that perform wiring, shielding, and computational functionalities. In this article, we demonstrate a vacuum thermocompression bonding technology that utilizes thin indium films as a welding agent to attach pairs of lithographically patterned chips. At 10 mK, we find a specific dc bond resistance of 49.2 μΩ cm2. We show good transmission up to 6.8 GHz in a tunnel-capped, bonded device as compared to a similar uncapped device. Finally, we fabricate and measure a set of tunnel-capped superconducting resonators, demonstrating that our bonding technology can be used in quantum computing applications.
Scalable architectures characterized by quantum bits (qubits) with low error rates are essential to the development of a practical quantum computer. In the superconducting quantum computing implementation, understanding and minimizing material losses are crucial to the improvement of qubit performance. A new material that has recently received particular attention is indium, a low-temperature superconductor that can be used to bond pairs of chips containing standard aluminum-based qubit circuitry. In this work, we characterize microwave loss in indium and aluminum/indium thin films on silicon substrates by measuring superconducting coplanar waveguide resonators and estimating the main loss parameters at powers down to the sub-photon regime and at temperatures between 10 and 450 mK. We compare films deposited by thermal evaporation, sputtering, and molecular beam epitaxy. We study the effects of heating in a vacuum and ambient atmospheric pressure as well as the effects of pre-deposition wafer cleaning using hydrofluoric acid. The microwave measurements are supported by thin film metrology including secondary-ion mass spectrometry. For thermally evaporated and sputtered films, we find that two-level state are the dominant loss mechanism at low photon number and temperature, with a loss tangent due to native indium oxide of ∼5×10−5. The molecular beam epitaxial films show evidence of the formation of a substantial indium-silicon eutectic layer, which leads to a drastic degradation in resonator performance.
Low-loss cavities are important in building high-coherence superconducting quantum computers. Generating high-quality joints between parts is crucial for the realization of a scalable quantum computer using the circuit quantum electrodynamics (cQED) framework. In this paper, we adapt the technique of indium bump bonding to cQED to realize high-quality superconducting microwave joints between chips. We use this technique to fabricate compact superconducting cavities in the multilayer microwave integrated quantum circuit (MMIQC) architecture and achieve single photon quality factors over 300 × 106 or single-photon lifetimes approaching 5 ms. To quantify the performance of the resulting seam, we fabricate microwave stripline resonators in multiple sections connected by different numbers of bonds, resulting in a wide range of seam admittances. The measured quality factors combined with the designed seam admittances allow us to bound the conductance of the seam at gseam≥2×1010/(Ω m). Such a conductance should enable the construction of micromachined superconducting cavities with a quality factor of at least a billion. These results demonstrate the capability to construct very high-quality microwave structures within the MMIQC architecture.
In recent years the interest in building quantum computers with superconducting qubits has steadily increased. Indium is one of the chosen interconnect materials for bonding qubit microchips with Josephson junctions to microelectronic resonators because indium is superconducting and ductile. Indium bump bonding is a common technique for hybridizing pixel radiation sensors to readout chips for some time; however, such detectors operate usually at room temperature. The challenge is to transfer this bonding technique to the fabrication of devices that can operate and withstand very low mKtemperatures. This paper summarizes the current challenges for implementing indium bump bonding to stacked superconducting qubit chips with a particular focus on chip parallelism and superconductivity of the interconnects. A high precision of parallelism between bonded qubit and resonator microchips is essential for minimizing signal loss, and superconducting materials such as indium are required for signal transfer. Photolithography or shadow masking techniques are commonly used to deposit severalμ\muμm-thick indium bumps on microchips. This paper outlines initial experiments to verify and optimize the indium bump deposition and flip-chip bonding for superconducting qubit chips. Stacked chip parallelism is evaluated after flip-chip bonding, the tolerance of the parallelism between stacked chips will be determined with an optical scanner, microscope and Scanning Electron Microscopy (SEM). For the superconductivity of interconnects, daisy chain chips are designed, built and flip-chip bonded. The common Under-Bump Metallization (UBM) for the adhesion of indium bumps to pixel pads requires modification with superconductive material and is investigated with resistance measurements that are taken at room temperature with a probe tester and at mK-temperature in a helium dilution refrigerator.
The performance of superconducting circuits for quantum computing is limited by materials losses. In particular, coherence times are typically bounded by two-level system (TLS) losses at single photon powers and millikelvin temperatures. The identification of low loss fabrication techniques, materials, and thin film dielectrics is critical to achieving scalable architectures for superconducting quantum computing. Superconducting microwave resonators provide a convenient qubit proxy for assessing performance and studying TLS loss and other mechanisms relevant to superconducting circuits such as non-equilibrium quasiparticles and magnetic flux vortices. In this review article, we provide an overview of considerations for designing accurate resonator experiments to characterize loss, including applicable types of losses, cryogenic setup, device design, and methods for extracting material and interface losses, summarizing techniques that have been evolving for over two decades. Results from measurements of a wide variety of materials and processes are also summarized. Finally, we present recommendations for the reporting of loss data from superconducting microwave resonators to facilitate materials comparisons across the field.
Flip-chip integration offers a promising route toward scalable superconducting quantum processors and hybrid semiconductor-superconductor quantum devices. We develop a three-dimensional transmon architecture using electroplated indium in which the qubit electric field is shared nearly equally between two bump-bonded substrates while maintaining low participation at the indium-bump interface. The resulting geometry is well suited for future hybrid qubits, enabling the integration of distinct material platforms while minimizing sensitivity to bump-interface loss. Using this platform, we evaluate electroplated indium interconnects for superconducting quantum circuits. Flip-chip transmons incorporating electroplated indium bumps exhibit qubit quality factors around 10610^6106. In addition, a systematic study of coplanar-waveguide resonators is used to identify losses associated with the electroplating process. In particular, we find that surface losses associated with the gold-layer, used to enable good electric contact with the indium, is likely the primary contributor to the qubit decay rate. These results demonstrate the compatibility of electroplated indium technology with high-coherence superconducting circuits and establish a promising platform for three-dimensional hybrid quantum integration.