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Chip scale atomic devices

Svenja A. Knappe, Peter D. D. Schwindt, Vladislav P. Gerginov, Vishal Shah, Alan S. Brannon, B. J. Lindseth, Li‐Anne Liew, H. G. Robinson, John Moreland, Zoya B. Popovic, Leo W. Hollberg, John E. Kitching

Published Mar 13, 2007• 0 citations
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Abstract Advanced integration technologies greatly enhance the prospects and reliability of practical quantum sensors, atomic clocks, and quantum information technologies. The performance and proliferation of these devices at chip scale is contingent upon developing low leak and low gas permeation vacuum cells using wafer-scale techniques. Here, we demonstrate a novel, low-leak-rate micro-knife bonding approach, enabling the realization of both atomic vapor cells and more complex evacuated atomic beam devices. These devices are fabricated using selective laser etching in a fused silica platform. The vapor cells are mechanically robust exhibiting shear-force strength ∼ 15 MPa, demonstrate long lifetimes ( > 1 year), low residual gas pressures ( ≪ 10 − 3 mbar ) , and leak rates below fine-leak testing sensitivity ( ≪ 2.8 × 10 − 10 mbar ⋅ l s − 1 ). Micro-knife bonding greatly simplifies the fabrication process for complex chip scale atom-beam devices and atomic vapor cells while identifying a path to future chip-scale cold atom devices, improved chip scale atomic clocks, and fieldable dissipation-dilution-limited optomechanics.

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Key Technologies in Developing Chip-Scale Hot Atomic Devices for Precision Quantum Metrology

Huiyao Yu, Xuyuan Zhang, Jian Zhang +4 more

Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physical parameters. The evolution of this field is propelled by a suite of sophisticated components, including miniaturized single-mode lasers, microfabricated alkali atom vapor cells, compact coil systems, scaled-down heating systems, and the application of cutting-edge micro-electro-mechanical system (MEMS) technologies. This review delves into the essential technologies needed to develop chip-scale hot atomic devices for quantum metrology, providing a comparative analysis of each technology's features. Concluding with a forward-looking perspective, this review discusses the future potential of chip-scale hot atomic devices and the critical technologies that will drive their advancement.

Micromachines•Aug 29, 2024•7 citations
Abstract Advanced integration technologies greatly enhance the prospects and reliability of practical quantum sensors, atomic clocks, and quantum information technologies. The performance and proliferation of these devices at chip scale is contingent upon developing low leak and low gas permeation vacuum cells using wafer-scale techniques. Here, we demonstrate a novel, low-leak-rate micro-knife bonding approach, enabling the realization of both atomic vapor cells and more complex evacuated atomic beam devices. These devices are fabricated using selective laser etching in a fused silica platform. The vapor cells are mechanically robust exhibiting shear-force strength ∼ 15 MPa, demonstrate long lifetimes ( > 1 year), low residual gas pressures ( ≪ 10 − 3 mbar ) , and leak rates below fine-leak testing sensitivity ( ≪ 2.8 × 10 − 10 mbar ⋅ l s − 1 ). Micro-knife bonding greatly simplifies the fabrication process for complex chip scale atom-beam devices and atomic vapor cells while identifying a path to future chip-scale cold atom devices, improved chip scale atomic clocks, and fieldable dissipation-dilution-limited optomechanics.
Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physical parameters. The evolution of this field is propelled by a suite of sophisticated components, including miniaturized single-mode lasers, microfabricated alkali atom vapor cells, compact coil systems, scaled-down heating systems, and the application of cutting-edge micro-electro-mechanical system (MEMS) technologies. This review delves into the essential technologies needed to develop chip-scale hot atomic devices for quantum metrology, providing a comparative analysis of each technology's features. Concluding with a forward-looking perspective, this review discusses the future potential of chip-scale hot atomic devices and the critical technologies that will drive their advancement.