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Optical and Quantum Sensing and Precision Metrology II

Chip-scale atomic beams: prospects for quantum devices on chip

Chandra Raman

Published Mar 9, 2022• 0 citations
Publisher
DOI
10.1117/12.2617006

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Advanced integration technologies greatly enhance the prospects and reliability of practical quantum sensors, atomic clocks, and quantum information technologies. The performance and proliferation of these devices at chip-scale is contingent upon developing low leak and low gas permeation vacuum cells using wafer-scale techniques. Here we demonstrate both evacuated atomic beam cells and atomic vapor cells using plastic deformation micro-knife bonding of selectively etched fused silica wafers. The cells are characterized using saturated absorption spectroscopy and fluorescence measurements. Vapor cells are mechanically robust exhibiting sheer-force strength (∼15\sim 15∼15MPa), demonstrate long lifetimes (>1> 1>1 year), low residual gas pressures $ (\ll 10^{-3} \, \text{mbar}) ,andleakratesbelowfine−leaktestingsensitivity(, and leak rates below fine-leak testing sensitivity (,andleakratesbelowfine−leaktestingsensitivity(\ll 2.8 \times 10^{-10} \frac{\text{mBar} \cdot \text{L}}{\text{s}}$). Micro-knife bonding greatly simplifies the fabrication process for complex chip scale atom-beam devices and atomic vapor cells while identifying a path to future chip-scale cold atom devices, improved chip scale atomic clocks, and fieldable dissipation-dilution-limited optomechanics.