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Microwave Electrometry with Rydberg Eletromagnetically Induced Transparency in Vapor Cells

Haoquan Fan

Published Jul 20, 2016• 0 citations
OpenAlex

Abstract

An atom-based approach is presented to detect absolute microwave (MW) electric fields (E-fields). The approach uses Rydberg atoms in vapor cells at room temperature. The MW E-field measurements utilize a bright resonance prepared within an electromagnetically induced transparency (EIT) window. The large transition dipole moments between energetically adjacent Rydberg states enable this method to make traceable E-field measurements with a sensitivity that is several orders of magnitude higher than the current standard for MW E-field measurements. The method can be used to image MW E-field in the near field regime with a subwavelength resolution of $\\mathrm{\\lambda_{MW}/650}$, where $\\mathrm{\\lambda_{MW}}$ is the wavelength of the MW E-field. A high accuracy of $\\mathrm{1\\%}$ has been reached by minimizing the effects of the vapor cell geometry on the measured MW E-field. The dissertation also presents an alternative technique to perform the MW E-field measurement using dispersive properties of the EIT spectrum with a prism vapor cell. Recently, we applied a homodyne detection technique with a Mach Zehnder interferometer to achieve a new sensitivity limit for the MW E-field measurement, $\\mathrm{\\sim3~\\mu Vcm^{-1}Hz^{-1/2}}$. The new sensitivity is one order of magnitude better than our prior best sensitivity presented in Ref. [Nat. Phys. 8, 819 (2012)]. The Rydberg atom-based method is promising to be a new standard for MW E-field measurements and to develop into portable devices in the field of MW technologies.

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Abstract A scheme for measuring microwave (MW) electric (E) fields is proposed based on bichromatic electromagnetically induced transparency (EIT) in Rydberg atoms. A bichromatic control field drives the excited state transition, whose absorption shows three EIT windows. When a MW field drives the Rydberg transition, the EIT windows split and six transmission peaks appear. It is interesting to find that the peak-to-peak distance of transmission spectrum is sensitive to the MW field strength, which can be used to measure MW E-field. Simulation results show that the measurement accuracy could be increased by about 4 times, and the minimum detectable strength of the MW E-field may be improved by about 3 times compared with the common EIT scheme. After the Doppler averaging, the minimum detectable MW E-field strength is about 5 times larger than that without Doppler effect. Also, we investigate other effects on the sensitivity of the system.

EPJ Quantum Technology•Jul 14, 2023•6 citations
An atom-based approach is presented to detect absolute microwave (MW) electric fields (E-fields). The approach uses Rydberg atoms in vapor cells at room temperature. The MW E-field measurements utilize a bright resonance prepared within an electromagnetically induced transparency (EIT) window. The large transition dipole moments between energetically adjacent Rydberg states enable this method to make traceable E-field measurements with a sensitivity that is several orders of magnitude higher than the current standard for MW E-field measurements. The method can be used to image MW E-field in the near field regime with a subwavelength resolution of mathrmlambdaMW/650\\mathrm{\\lambda_{MW}/650}mathrmlambdaMW​/650, where mathrmlambdaMW\\mathrm{\\lambda_{MW}}mathrmlambdaMW​ is the wavelength of the MW E-field. A high accuracy of \\mathrm{1\\%} has been reached by minimizing the effects of the vapor cell geometry on the measured MW E-field. The dissertation also presents an alternative technique to perform the MW E-field measurement using dispersive properties of the EIT spectrum with a prism vapor cell. Recently, we applied a homodyne detection technique with a Mach Zehnder interferometer to achieve a new sensitivity limit for the MW E-field measurement, mathrmsim3 muVcm−1Hz−1/2\\mathrm{\\sim3~\\mu Vcm^{-1}Hz^{-1/2}}mathrmsim3 muVcm−1Hz−1/2. The new sensitivity is one order of magnitude better than our prior best sensitivity presented in Ref. [Nat. Phys. 8, 819 (2012)]. The Rydberg atom-based method is promising to be a new standard for MW E-field measurements and to develop into portable devices in the field of MW technologies.
Significant progress has been made in atom-based measurements of length, time, gravity and electromagnetic fields in recently years. Rydberg atom-based microwave electric field measurement, using electromagnetically induced transparency (EIT) in room temperature alkali-metal vapors, has been extensively investigated and aroused the broad interest. This approach may establish a new standard for the measurements of microwave (MW) and radio frequency (RF) electric fields.In this review, we describe the work on a new method of measuring electric fields based on quantum interference by using either cesium or rubidium atoms contained in a dielectric vapor cell. Rydberg atoms with principal quantum number n >>1 have large direct current (DC) polarizabilities and microwave transition dipole moments, thereby making them extremely sensitive to external electric fields. Using the Rydberg three-level EIT to detect the level splitting and shift that is induced by the external field, we can realize a rapid and robust self-calibration method of measuring the electric field in a frequency range from 0.01 GHz to 1000 GHz. For the MW electric field (frequency range > 1 GHz), the MW field causes the Rydberg states to split, known as an Autler-Townes splitting (A-T) effect when the applied microwave can resonate with adjacent Rydberg states. The MW coupled A-T splitting is proportional to the applied electric field strength, from which the field strength is measured. Using the EIT window, a high sensitivity of 3 μV·cm-1·Hz-1/2 and small electric field of 1 μV/cm are expected to be achieved with a modest setup, and the limitations of the sensitivity are also addressed in the review. For the RF field at frequency mj EIT lines, and avoided crossings formed with the fine-structure levels of equal mj and different J's, which is used to calibrate and measure the RF field amplitude. On the other hand, the dependence of the EIT-line strength on the RF field polarization provides a fast and robust polarization measurement of RF fields based on matching experimental data with a theoretical simulation. The measurements of minimum strengths and sensitivity of RF fields based on Rydberg atoms are one order magnitude below the values obtained by traditional antenna methods. The atom-based field measurement paves the way for determining fields through calibration-free, invariable atomic properties and miniaturization. We also propose its various potential applications in the future.
We have recently shown [Nat. Phys.8, 819 (2012)] that Alkali atoms contained in a vapor cell can serve as a highly accurate standard for microwave (MW) electric field strength as well as polarization. Here we show for the first time that Rydberg atom electromagnetically induced transparency can be used to image MW electric fields with unprecedented precision. The spatial resolution of the method is far into the subwavelength regime ∼λ/650 or 66 μm at 6.9 GHz. The electric field resolutions are similar to those we have already demonstrated ∼50 μV cm(-1). Our experimental results agree with finite element calculations of test electric-field patterns.
Abstract In this study, we investigated Rydberg atom-based microwave (MW) electrometry using polarization spectroscopy in a room-temperature vapor cell. By measuring Autler-Townes splitting in the electromagnetically induced transparency (EIT) spectrum, we determined that the minimum measurable MW electric field is approximately five times lower than conventional EIT techniques. The results are well reproduced by a full optical Bloch equation model, which takes into account all the hyperfine levels involved. Subsequently, the EIT setup was used to characterize a custom MW cylindrical lens, which increases the field at the focus by a factor of three, decreasing the minimum measurable MW electric field by the same amount. Our results indicate that the combination of polarization spectroscopy and a MW lens may enhance MW electrometry, and may allow its use as a secondary standard.
We have shown that Rydberg states can be used for high-sensitivity, absolute sensing of microwave (MW) electric fields. We achieved a sensitivity of 3 μVcm-1Hz-1/2 for two read-out strategies. Depending on the spectral resolution of the read-out, either the MW induced transmission line frequency splitting, the Autler-Townes regime, or a change in the on-resonant absorption, the amplitude regime, can be used to determine the MW electric field. Results using a Mach-Zehnder interferometer and frequency modulated spectroscopy both achieve similar photon shot noise limited sensitivity. In addition, we have also explored amplitude modulation and the displacement of a probe laser beam due to index of refraction changes in a prism shaped vapor cell. These latter methods were not able to achieve photon shot noise limited performance. Fundamental limits to the sensitivity of the Rydberg atom-based MW electric field sensing have been addressed, but it is important to clarify the differences between noise in different parts or subsystems of the sensor. Shot noise in the probe laser usually dominates the projection noise of the atoms participating in the measurement of the MW electric field because of the desire to operate at low effective Rydberg atom densities in order to avoid collisional dephasing and ionization.
We recently proposed a method to detect weak microwave electric field ~8µV/cm with sensitivity ~ 30 µV cm−1Hz−1/2 [Nat. Phys. 8, 819 (2012)]. This technique is based on Rydberg atoms using the concept of electromagnetically induced transparency in room temperature vapor cells. Here we show that frequency modulation spectroscopy with active control of residual amplitude modulation improves the read out signal-to-noise. The method has the potential for high sensitivity and can be self-calibrated.
Abstract A scheme for measuring microwave (MW) electric (E) fields is proposed based on bichromatic electromagnetically induced transparency (EIT) in Rydberg atoms. A bichromatic control field drives the excited state transition, whose absorption shows three EIT windows. When a MW field drives the Rydberg transition, the EIT windows split and six transmission peaks appear. It is interesting to find that the peak-to-peak distance of transmission spectrum is sensitive to the MW field strength, which can be used to measure MW E-field. Simulation results show that the measurement accuracy could be increased by about 4 times, and the minimum detectable strength of the MW E-field may be improved by about 3 times compared with the common EIT scheme. After the Doppler averaging, the minimum detectable MW E-field strength is about 5 times larger than that without Doppler effect. Also, we investigate other effects on the sensitivity of the system.