EPJ Quantum Technology

Microwave electrometry with bichromatic electromagnetically induced transparency in Rydberg atoms

Mingzhi Han, He Hao, Xiaoyun Song, Yin Zheng, Michal P. Parniak, Zhengmao Jia, Yandong Peng

Published Jul 14, 2023• 6 citations

Abstract

Abstract A scheme for measuring microwave (MW) electric (E) fields is proposed based on bichromatic electromagnetically induced transparency (EIT) in Rydberg atoms. A bichromatic control field drives the excited state transition, whose absorption shows three EIT windows. When a MW field drives the Rydberg transition, the EIT windows split and six transmission peaks appear. It is interesting to find that the peak-to-peak distance of transmission spectrum is sensitive to the MW field strength, which can be used to measure MW E-field. Simulation results show that the measurement accuracy could be increased by about 4 times, and the minimum detectable strength of the MW E-field may be improved by about 3 times compared with the common EIT scheme. After the Doppler averaging, the minimum detectable MW E-field strength is about 5 times larger than that without Doppler effect. Also, we investigate other effects on the sensitivity of the system.

DOI: 10.1140/epjqt/s40507-023-00184-z

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