Physical Review Letters
X-Ray Parametric Down-Conversion in the Langevin Regime
S. Shwartz, Ryan Coffee, Jan M. Feldkamp, Yiping Feng, J. B. Hastings, G. Y. Yin, Stephen E. Harris
Abstract
We experimentally and theoretically study the coincidence count rate for down-converted x-ray photons. Because of photoionization, parametric down-conversion at x-ray wavelengths generally involves loss and the theoretical description requires a Langevin approach. By working in a transmission geometry (Laue) rather than in the Bragg geometry of previous experiments, we obtain an improvement in the signal-to-noise ratio of 12.5, and find agreement between experiment and theory.