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Applied Physics Letters

Single shot spin readout using a cryogenic high-electron-mobility transistor amplifier at sub-Kelvin temperatures

Lisa A Tracy, Dwight Luhman, Stephen M Carr, Nathaniel C. Bishop, Gregory A. Ten Eyck, Tammy C. Pluym, J. R. Wendt, Michael P Lilly, Malcolm S. Carroll

Published Feb 8, 2016• 57 citations
Publisher

Abstract

We use a cryogenic high-electron-mobility transistor circuit to amplify the current from a single electron transistor, allowing for demonstration of single shot readout of an electron spin on a single P donor in Si with 100 kHz bandwidth and a signal to noise ratio of ∼9. In order to reduce the impact of cable capacitance, the amplifier is located adjacent to the Si sample, at the mixing chamber stage of a dilution refrigerator. For a current gain of ∼2.7×103, the power dissipation of the amplifier is 13 μW, the bandwidth is ∼1.3 MHz, and for frequencies above 300 kHz the current noise referred to input is ≤70 fA/Hz. With this amplification scheme, we are able to observe coherent oscillations of a P donor electron spin in isotopically enriched 28Si with 96% visibility.

DOI
10.1063/1.4941421

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Applied Physics Letters•Oct 4, 2004•18 citations
We use a cryogenic high-electron-mobility transistor circuit to amplify the current from a single electron transistor, allowing for demonstration of single shot readout of an electron spin on a single P donor in Si with 100 kHz bandwidth and a signal to noise ratio of ∼9. In order to reduce the impact of cable capacitance, the amplifier is located adjacent to the Si sample, at the mixing chamber stage of a dilution refrigerator. For a current gain of ∼2.7×103, the power dissipation of the amplifier is 13 μW, the bandwidth is ∼1.3 MHz, and for frequencies above 300 kHz the current noise referred to input is ≤70 fA/Hz. With this amplification scheme, we are able to observe coherent oscillations of a P donor electron spin in isotopically enriched 28Si with 96% visibility.
Abstract High-fidelity single-shot readout of spin qubits requires distinguishing states much faster than the T 1 time of the spin state. One approach to improving readout fidelity and bandwidth (BW) is cryogenic amplification, where the signal from the qubit is amplified before noise sources are introduced and room-temperature amplifiers can operate at lower gain and higher BW. We compare the performance of two cryogenic amplification circuits: a current-biased heterojunction bipolar transistor circuit (CB-HBT), and an AC-coupled HBT circuit (AC-HBT). Both circuits are mounted on the mixing-chamber stage of a dilution refrigerator and are connected to silicon metal oxide semiconductor (Si-MOS) quantum dot devices on a printed circuit board (PCB). The power dissipated by the CB-HBT ranges from 0.1 to 1 μ W whereas the power of the AC-HBT ranges from 1 to 20 μ W. Referred to the input, the noise spectral density is low for both circuits, in the 15 to 30 fA/ Hz\sqrt{{\bf{Hz}}}Hz​ Hz range. The charge sensitivity for the CB-HBT and AC-HBT is 330 μ e/ Hz\sqrt{{\bf{Hz}}}Hz​ Hz and 400 μ e/ Hz\sqrt{{\bf{Hz}}}Hz​ Hz , respectively. For the single-shot readout performed, less than 10 μ s is required for both circuits to achieve bit error rates below 10 −3 , which is a putative threshold for quantum error correction.
Abstract An electron-on-helium qubit is a promising physical platform for quantum information technologies. Among all the “blueprints” for the qubit realization, a hybrid Rydberg-spin qubit seems to be a promising one toward quantum computing using electron spins. The main technological challenge on the way to such qubits is a detection of fA range image current induced by a Rydberg transition of a single electron. To address this problem, we aim to use a tank LC-circuit in conjunction with a high-impedance and low power dissipation cryogenic amplifier. Here, we report our progress toward realization of a resonant image current detector with a homemade cryogenic amplifier based on FHX13LG HEMT. We present a detailed characterization of the transistor at room and cryogenic temperatures, as well as details of the amplifier design and performance. At the power dissipation level of amplifier well below 100 μW, the measured voltage and current noise level are 0.6 nV/Hz0.6~{\hbox {nV}}/\sqrt{\textrm{Hz}}0.6 nV/Hz​ 0.6 nV / Hz and below 1.5 fA/ Hz\sqrt{\textrm{Hz}}Hz​ Hz , respectively. Based on the actual image current measurements of the Rydberg transition in a many-electron system on liquid helium, we estimate an SNR = 8 with a measurement bandwidth 1 Hz for the detection of a single-electron transition, providing the noise level at the output is solely determined by the noise of the amplifier.
High-fidelity single-shot readout of spin qubits requires distinguishing states much faster than the T1 time of the spin state. One approach to improving readout fidelity and bandwidth (BW) is cryogenic amplification, where the signal from the qubit is amplified before noise sources are introduced and room-temperature amplifiers can operate at lower gain and higher BW. We compare the performance of two cryogenic amplification circuits: a current-biased heterojunction bipolar transistor circuit (CB-HBT), and an AC-coupled HBT circuit (AC-HBT). Both circuits are mounted on the mixing-chamber stage of a dilution refrigerator and are connected to silicon metal oxide semiconductor (Si-MOS) quantum dot devices on a printed circuit board (PCB). The power dissipated by the CB-HBT ranges from 0.1 to 1 μW whereas the power of the AC-HBT ranges from 1 to 20 μW. Referred to the input, the noise spectral density is low for both circuits, in the 15 to 30 fA/Hz\sqrt{\textrm{Hz}}Hz​ range. The charge sensitivity for the CB-HBT and AC-HBT is 330 μe/Hz\sqrt{\textrm{Hz}}Hz​ and 400 μe/Hz\sqrt{\textrm{Hz}}Hz​, respectively. For the single-shot readout performed, less than 10 μs is required for both circuits to achieve bit error rates below 10−310^{-3}10−3, which is a putative threshold for quantum error correction.
We examine a silicon-germanium heterojunction bipolar transistor (HBT) for cryogenic pre-amplification of a single electron transistor (SET). The SET current modulates the base current of the HBT directly. The HBT-SET circuit is immersed in liquid helium, and its frequency response from low frequency to several MHz is measured. The current gain and the noise spectrum with the HBT result in a signal-to-noise-ratio (SNR) that is a factor of 10–100 larger than without the HBT at lower frequencies. The transition frequency defined by SNR = 1 has been extended by as much as a factor of 10 compared to without the HBT amplification. The power dissipated by the HBT cryogenic pre-amplifier is approximately 5 nW to 5 μW for the investigated range of operation. The circuit is also operated in a single electron charge read-out configuration in the time-domain as a proof-of-principle demonstration of the amplification approach for single spin read-out.
Semiconducting qubits are a promising platform for quantum computers. In particular, silicon spin qubits have made a number of advancements recently including long coherence times, high-fidelity single-qubit gates, two-qubit gates, and high-fidelity readout. However, all operations likely require improvement in fidelity and speed, if possible, to realize a quantum computer. Readout fidelity and speed, in general, are limited by circuit challenges centered on extracting low signal from a device in a dilution refrigerator connected to room temperature amplifiers by long coaxial cables with relatively high capacitance. Readout fidelity specifically is limited by the time it takes to reliably distinguish qubit states relative to the characteristic decay time of the excited state, T1. This dissertation explores the use of heterojunction bipolar transistor (HBT) circuits to amplify the readout signal of silicon spin qubits at cryogenic temperatures. The cryogenic amplification approach has numerous advantages including low implementation overhead, low power relative to the available cooling power, and high signal gain at the mixing chamber stage leading to around a factor of ten speedup in readout time for a similar signal-to-noise ratio. The faster readout time generally increases fidelity, since it is much faster than the T1 time. Two HBT amplification circuits have been designed and characterized. One design is a low-power, base-current biased configuration with non-linear gain (CB-HBT), and the second is a linear-gain, AC-coupled configuration (AC-HBT). They can operate at powers of 1 and 10 μW, respectfully, and not significantly heat electrons. The noise spectral density referred to the input for both circuits is around 15 to 30 fA/√Hz, which is low compared to previous cases such as the dual-stage, AC-coupled HEMT circuit at ~ 70 fA/√Hz. Both circuits achieve charge sensitivity between 300 and 400 μe/√Hz, which approaches the best alternatives (e.g., RF-SET at ~ 140 μe/√Hz) but with much less implementation overhead. For the single-shot latched charge readout performed, both circuits achieve high-fidelity readout in times < 10 μs with bit error rates < 10-3, which is a great improvement over previous work at > 70 μs. The readout speed-up in principle also reduces the production of errors due to excited state relaxation by a factor of ~ 10. All of these results are possible with relatively simple, low-power transistor circuits which can be mounted close to the qubit device at the mixing chamber stage of the dilution refrigerator.
Two versions of a cryogenic multistage pseudomorphic high-electron-mobility field-effect transistor amplifier (based on the AlGaAs/InGaAs/GaAs heterostructure) have been designed for quantum device readout and tested at an ambient temperature ∼380mK. The minimum noise temperature of the first amplifier version is below 110±25mK(∼80±20hf∕kB) at 28.6 MHz, estimated from the noise of input 10 kΩ resistance and coupled input tank circuit with an active resistance at the resonant frequency RS(f0)≈17.9kΩ. Its minimum voltage spectral noise density, with respect to the input, is about 200pV∕(Hz)1∕2 and the corner frequency of the 1∕f noise is close to 300 kHz. For the amplifier with the lowest designed back action, the minimum noise temperature below 130±30mK(∼100±25hf∕kB) at 26.8 MHz was estimated when coupled to an input tank circuit with RS(f0)≈61.8kΩ. The power consumption of the amplifiers is in the range of 100–600 μW.