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arXiv:1901.04570

Single-Shot Readout Performance of Two Heterojunction-Bipolar-Transistor Amplification Circuits at Millikelvin Temperatures

Matthew Curry, Rudolph, M., Troy D. England, Andrew M. Mounce, Ryan Jock, Chloé Bureau-Oxton, Patrick Harvey-Collard, Peter Anand Sharma, John M. Anderson, DeAnna Campbell, J. R. Wendt, Daniel R. Ward, Stephen M Carr, Michael P Lilly, Malcolm S. Carroll

Published Jan 14, 2019• 2 citations
arXivHTMLPDF

Abstract

High-fidelity single-shot readout of spin qubits requires distinguishing states much faster than the T1 time of the spin state. One approach to improving readout fidelity and bandwidth (BW) is cryogenic amplification, where the signal from the qubit is amplified before noise sources are introduced and room-temperature amplifiers can operate at lower gain and higher BW. We compare the performance of two cryogenic amplification circuits: a current-biased heterojunction bipolar transistor circuit (CB-HBT), and an AC-coupled HBT circuit (AC-HBT). Both circuits are mounted on the mixing-chamber stage of a dilution refrigerator and are connected to silicon metal oxide semiconductor (Si-MOS) quantum dot devices on a printed circuit board (PCB). The power dissipated by the CB-HBT ranges from 0.1 to 1 μW whereas the power of the AC-HBT ranges from 1 to 20 μW. Referred to the input, the noise spectral density is low for both circuits, in the 15 to 30 fA/$\sqrt{\textrm{Hz}}$ range. The charge sensitivity for the CB-HBT and AC-HBT is 330 μe/$\sqrt{\textrm{Hz}}$ and 400 μe/$\sqrt{\textrm{Hz}}$, respectively. For the single-shot readout performed, less than 10 μs is required for both circuits to achieve bit error rates below $10^{-3}$, which is a putative threshold for quantum error correction.

DOI
10.48550/arxiv.1901.04570

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Single-Shot Readout Performance of Two Heterojunction-Bipolar-Transistor Amplification Circuits at Millikelvin Temperatures

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Abstract High-fidelity single-shot readout of spin qubits requires distinguishing states much faster than the T 1 time of the spin state. One approach to improving readout fidelity and bandwidth (BW) is cryogenic amplification, where the signal from the qubit is amplified before noise sources are introduced and room-temperature amplifiers can operate at lower gain and higher BW. We compare the performance of two cryogenic amplification circuits: a current-biased heterojunction bipolar transistor circuit (CB-HBT), and an AC-coupled HBT circuit (AC-HBT). Both circuits are mounted on the mixing-chamber stage of a dilution refrigerator and are connected to silicon metal oxide semiconductor (Si-MOS) quantum dot devices on a printed circuit board (PCB). The power dissipated by the CB-HBT ranges from 0.1 to 1 μ W whereas the power of the AC-HBT ranges from 1 to 20 μ W. Referred to the input, the noise spectral density is low for both circuits, in the 15 to 30 fA/ $$\sqrt{{\bf{Hz}}}$$ Hz range. The charge sensitivity for the CB-HBT and AC-HBT is 330 μ e/ $$\sqrt{{\bf{Hz}}}$$ Hz and 400 μ e/ $$\sqrt{{\bf{Hz}}}$$ Hz , respectively. For the single-shot readout performed, less than 10 μ s is required for both circuits to achieve bit error rates below 10 −3 , which is a putative threshold for quantum error correction.

Scientific Reports•Nov 18, 2019•27 citations

Improving the Readout of Semiconducting Qubits

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Semiconducting qubits are a promising platform for quantum computers. In particular, silicon spin qubits have made a number of advancements recently including long coherence times, high-fidelity single-qubit gates, two-qubit gates, and high-fidelity readout. However, all operations likely require improvement in fidelity and speed, if possible, to realize a quantum computer. Readout fidelity and speed, in general, are limited by circuit challenges centered on extracting low signal from a device in a dilution refrigerator connected to room temperature amplifiers by long coaxial cables with relatively high capacitance. Readout fidelity specifically is limited by the time it takes to reliably distinguish qubit states relative to the characteristic decay time of the excited state, T1. This dissertation explores the use of heterojunction bipolar transistor (HBT) circuits to amplify the readout signal of silicon spin qubits at cryogenic temperatures. The cryogenic amplification approach has numerous advantages including low implementation overhead, low power relative to the available cooling power, and high signal gain at the mixing chamber stage leading to around a factor of ten speedup in readout time for a similar signal-to-noise ratio. The faster readout time generally increases fidelity, since it is much faster than the T1 time. Two HBT amplification circuits have been designed and characterized. One design is a low-power, base-current biased configuration with non-linear gain (CB-HBT), and the second is a linear-gain, AC-coupled configuration (AC-HBT). They can operate at powers of 1 and 10 μW, respectfully, and not significantly heat electrons. The noise spectral density referred to the input for both circuits is around 15 to 30 fA/√Hz, which is low compared to previous cases such as the dual-stage, AC-coupled HEMT circuit at ~ 70 fA/√Hz. Both circuits achieve charge sensitivity between 300 and 400 μe/√Hz, which approaches the best alternatives (e.g., RF-SET at ~ 140 μe/√Hz) but with much less implementation overhead. For the single-shot latched charge readout performed, both circuits achieve high-fidelity readout in times < 10 μs with bit error rates < 10-3, which is a great improvement over previous work at > 70 μs. The readout speed-up in principle also reduces the production of errors due to excited state relaxation by a factor of ~ 10. All of these results are possible with relatively simple, low-power transistor circuits which can be mounted close to the qubit device at the mixing chamber stage of the dilution refrigerator.

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We examine a silicon-germanium heterojunction bipolar transistor (HBT) for cryogenic pre-amplification of a single electron transistor (SET). The SET current modulates the base current of the HBT directly. The HBT-SET circuit is immersed in liquid helium, and its frequency response from low frequency to several MHz is measured. The current gain and the noise spectrum with the HBT result in a signal-to-noise-ratio (SNR) that is a factor of 10–100 larger than without the HBT at lower frequencies. The transition frequency defined by SNR = 1 has been extended by as much as a factor of 10 compared to without the HBT amplification. The power dissipated by the HBT cryogenic pre-amplifier is approximately 5 nW to 5 μW for the investigated range of operation. The circuit is also operated in a single electron charge read-out configuration in the time-domain as a proof-of-principle demonstration of the amplification approach for single spin read-out.

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We use a cryogenic high-electron-mobility transistor circuit to amplify the current from a single electron transistor, allowing for demonstration of single shot readout of an electron spin on a single P donor in Si with 100 kHz bandwidth and a signal to noise ratio of ∼9. In order to reduce the impact of cable capacitance, the amplifier is located adjacent to the Si sample, at the mixing chamber stage of a dilution refrigerator. For a current gain of ∼2.7×103, the power dissipation of the amplifier is 13 μW, the bandwidth is ∼1.3 MHz, and for frequencies above 300 kHz the current noise referred to input is ≤70 fA/Hz. With this amplification scheme, we are able to observe coherent oscillations of a P donor electron spin in isotopically enriched 28Si with 96% visibility.

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Tunable tunnel coupling s AC-coupled single stage SiGe HBT amplification s Readout

•Jul 14, 2021•0 citations
High-fidelity single-shot readout of spin qubits requires distinguishing states much faster than the T1 time of the spin state. One approach to improving readout fidelity and bandwidth (BW) is cryogenic amplification, where the signal from the qubit is amplified before noise sources are introduced and room-temperature amplifiers can operate at lower gain and higher BW. We compare the performance of two cryogenic amplification circuits: a current-biased heterojunction bipolar transistor circuit (CB-HBT), and an AC-coupled HBT circuit (AC-HBT). Both circuits are mounted on the mixing-chamber stage of a dilution refrigerator and are connected to silicon metal oxide semiconductor (Si-MOS) quantum dot devices on a printed circuit board (PCB). The power dissipated by the CB-HBT ranges from 0.1 to 1 μW whereas the power of the AC-HBT ranges from 1 to 20 μW. Referred to the input, the noise spectral density is low for both circuits, in the 15 to 30 fA/Hz\sqrt{\textrm{Hz}}Hz​ range. The charge sensitivity for the CB-HBT and AC-HBT is 330 μe/Hz\sqrt{\textrm{Hz}}Hz​ and 400 μe/Hz\sqrt{\textrm{Hz}}Hz​, respectively. For the single-shot readout performed, less than 10 μs is required for both circuits to achieve bit error rates below 10−310^{-3}10−3, which is a putative threshold for quantum error correction.
Abstract High-fidelity single-shot readout of spin qubits requires distinguishing states much faster than the T 1 time of the spin state. One approach to improving readout fidelity and bandwidth (BW) is cryogenic amplification, where the signal from the qubit is amplified before noise sources are introduced and room-temperature amplifiers can operate at lower gain and higher BW. We compare the performance of two cryogenic amplification circuits: a current-biased heterojunction bipolar transistor circuit (CB-HBT), and an AC-coupled HBT circuit (AC-HBT). Both circuits are mounted on the mixing-chamber stage of a dilution refrigerator and are connected to silicon metal oxide semiconductor (Si-MOS) quantum dot devices on a printed circuit board (PCB). The power dissipated by the CB-HBT ranges from 0.1 to 1 μ W whereas the power of the AC-HBT ranges from 1 to 20 μ W. Referred to the input, the noise spectral density is low for both circuits, in the 15 to 30 fA/ Hz\sqrt{{\bf{Hz}}}Hz​ Hz range. The charge sensitivity for the CB-HBT and AC-HBT is 330 μ e/ Hz\sqrt{{\bf{Hz}}}Hz​ Hz and 400 μ e/ Hz\sqrt{{\bf{Hz}}}Hz​ Hz , respectively. For the single-shot readout performed, less than 10 μ s is required for both circuits to achieve bit error rates below 10 −3 , which is a putative threshold for quantum error correction.
Semiconducting qubits are a promising platform for quantum computers. In particular, silicon spin qubits have made a number of advancements recently including long coherence times, high-fidelity single-qubit gates, two-qubit gates, and high-fidelity readout. However, all operations likely require improvement in fidelity and speed, if possible, to realize a quantum computer. Readout fidelity and speed, in general, are limited by circuit challenges centered on extracting low signal from a device in a dilution refrigerator connected to room temperature amplifiers by long coaxial cables with relatively high capacitance. Readout fidelity specifically is limited by the time it takes to reliably distinguish qubit states relative to the characteristic decay time of the excited state, T1. This dissertation explores the use of heterojunction bipolar transistor (HBT) circuits to amplify the readout signal of silicon spin qubits at cryogenic temperatures. The cryogenic amplification approach has numerous advantages including low implementation overhead, low power relative to the available cooling power, and high signal gain at the mixing chamber stage leading to around a factor of ten speedup in readout time for a similar signal-to-noise ratio. The faster readout time generally increases fidelity, since it is much faster than the T1 time. Two HBT amplification circuits have been designed and characterized. One design is a low-power, base-current biased configuration with non-linear gain (CB-HBT), and the second is a linear-gain, AC-coupled configuration (AC-HBT). They can operate at powers of 1 and 10 μW, respectfully, and not significantly heat electrons. The noise spectral density referred to the input for both circuits is around 15 to 30 fA/√Hz, which is low compared to previous cases such as the dual-stage, AC-coupled HEMT circuit at ~ 70 fA/√Hz. Both circuits achieve charge sensitivity between 300 and 400 μe/√Hz, which approaches the best alternatives (e.g., RF-SET at ~ 140 μe/√Hz) but with much less implementation overhead. For the single-shot latched charge readout performed, both circuits achieve high-fidelity readout in times < 10 μs with bit error rates < 10-3, which is a great improvement over previous work at > 70 μs. The readout speed-up in principle also reduces the production of errors due to excited state relaxation by a factor of ~ 10. All of these results are possible with relatively simple, low-power transistor circuits which can be mounted close to the qubit device at the mixing chamber stage of the dilution refrigerator.
We examine a silicon-germanium heterojunction bipolar transistor (HBT) for cryogenic pre-amplification of a single electron transistor (SET). The SET current modulates the base current of the HBT directly. The HBT-SET circuit is immersed in liquid helium, and its frequency response from low frequency to several MHz is measured. The current gain and the noise spectrum with the HBT result in a signal-to-noise-ratio (SNR) that is a factor of 10–100 larger than without the HBT at lower frequencies. The transition frequency defined by SNR = 1 has been extended by as much as a factor of 10 compared to without the HBT amplification. The power dissipated by the HBT cryogenic pre-amplifier is approximately 5 nW to 5 μW for the investigated range of operation. The circuit is also operated in a single electron charge read-out configuration in the time-domain as a proof-of-principle demonstration of the amplification approach for single spin read-out.
High-fidelity single-shot readout of superconducting qubits is essential for fault-tolerant quantum computation. Without a quantum-limited amplifier such as a Josephson parametric amplifier, the cryogenic high-electron-mobility-transistor (HEMT) low-noise amplifier (LNA) at the 4 K stage is the dominant noise source in the readout chain. HEMT LNAs are conventionally characterized by Y-factor measurements of the noise temperature TNT_NTN​, independently of the quantum measurement they ultimately serve. Here we present a qubit-in-the-loop benchmarking method. The method uses the two-dimensional IQ histogram of single-shot readout as a direct figure of merit. We apply it to three state-of-the-art cryogenic InP HEMT LNAs with 53\%, 60\%, and 70\% channel indium content, together with a commercial reference amplifier. The 60\% and 70\% devices have similar TNT_NTN​ in Y-factor measurements, both lower than the 53\% device. The 70\% device has the highest gain, but qubit readout SNR and assignment fidelity Fa\mathcal{F}_aFa​ instead peak at 60\%. Using this method, we map Fa\mathcal{F}_aFa​ against HEMT LNA dc power consumption for each device. Fa\mathcal{F}_aFa​ does not simply saturate with increasing power. For several devices it declines above a device-dependent power well below typical operating points. For the 60\% device, which has the highest overall Fa\mathcal{F}_aFa​, about 1~mW is needed to maintain Fa>85%\mathcal{F}_a > 85\%Fa​>85%. Across all four devices, Fa>80%\mathcal{F}_a > 80\%Fa​>80% is reached with as little as about 0.3~mW, roughly an order of magnitude below typical operating points. These results establish a qubit-referenced benchmarking methodology and provide practical guidance for amplifier selection and bias in power-constrained multi-qubit readout systems.
We use a cryogenic high-electron-mobility transistor circuit to amplify the current from a single electron transistor, allowing for demonstration of single shot readout of an electron spin on a single P donor in Si with 100 kHz bandwidth and a signal to noise ratio of ∼9. In order to reduce the impact of cable capacitance, the amplifier is located adjacent to the Si sample, at the mixing chamber stage of a dilution refrigerator. For a current gain of ∼2.7×103, the power dissipation of the amplifier is 13 μW, the bandwidth is ∼1.3 MHz, and for frequencies above 300 kHz the current noise referred to input is ≤70 fA/Hz. With this amplification scheme, we are able to observe coherent oscillations of a P donor electron spin in isotopically enriched 28Si with 96% visibility.