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Europhysics Letters (EPL)

Effects of LC shunting on the Shapiro steps features of Josephson junction

Yu. M. Shukrinov, I. R. Rahmonov, K. V. Kulikov, P. Seidel

Published May 1, 2015• 18 citations
Publisher

Abstract

We study an effect of external radiation on the dynamics of Josephson junction shunted by an LC circuit. When the Josephson frequency is equal to the frequency of the circuit, additional stable resonant circuit branches appear in the IV -characteristic of the junction. The branches occur on the stable side of a narrow resonance peak, while the other peak side has a negative slope and is unstable. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the resonant circuit branch. These effects might give very important advantages for methods and technologies that exploit the response of Josephson junctions to microwave fields.

DOI
10.1209/0295-5075/110/47001

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We study an effect of external radiation on the dynamics of Josephson junction shunted by an LC circuit. When the Josephson frequency is equal to the frequency of the circuit, additional stable resonant circuit branches appear in the IV -characteristic of the junction. The branches occur on the stable side of a narrow resonance peak, while the other peak side has a negative slope and is unstable. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the resonant circuit branch. These effects might give very important advantages for methods and technologies that exploit the response of Josephson junctions to microwave fields.
The effect of external radiation on the phase dynamics of Josephson junctions shunted by an LC circuit is examined. It is shown that additional resonant circuit (rc) branches appear in the current voltage characteristics of the junctions when the Josephson frequency is equal to the frequency of the formed resonance circuit. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the rc-branch in comparison to the case of Josephson junction without shunt. The experimental implementation of these effects might give very important advantages for existing methods and technologies.
We have analyzed the phase dynamics and current–voltage characteristics of a Josephson junction shunted by an LC circuit. When the Josephson frequency ω J becomes equal to the natural frequency ωrc of the formed resonance circuit, the I–V curve acquires additional branches. We have studied the features of the rc branch and the superconducting circuit for different values of the resonance frequency. It is shown that the maximal superconducting current through the Josephson junction on the rc-branch depends on the resonance frequency and is determined by the closeness of the end point of the rc branch to the critical current. We have determined the dependence of the maximal superconducting current on the resonance frequency for different values of the dissipation parameters. The limiting value of the maximal superconducting current is independent (to within 1%) of the parameters of the system.
An experimental investigation is made of the subharmonic Shapiro steps observed on the I-V curves of high-T c superconductor Josephson junctions and on the bias-voltage dependences of the rf noise and detector response when the junctions are subjected to external submillimeter radiation. Structures of this type are ordinarily described by a nonsinusoidal current-phase relation, which is why subharmonic steps appear. Numerical modeling of the processes occurring in a Josephson junction by means of a simple current-phase relation, as in the case of an SNS junction, gives good agreement with experiment. The width of the characteristic Josephson generation line of the junction was estimated on the basis of the noise dependences and the selective detector response. The width can be explained by taking into account the shot noise of the tunneling component of the conductivity. A model of the conductivity of a high-T c superconductor Josephson junction, consisting of a tunnel junction with microshorts possessing metallic conductivity, is discussed.
We consider a Josephson junction coupled to a high-quality parallel resonance circuit under microwave irradiation on the resonance frequency. The phase locking of Josephson oscillations, manifesting itself through Shapiro steps, is studied using an analytical theory developed for the circuit. Substantial change in the amplitude of the oscillating component of the Josephson phase within the phase-locking range determines specificity of the step behavior. This analysis is compared with the results of a numerical simulation.
We investigate IV -characteristics of coupled Josephson junctions which model the intrinsic Josephson junctions in high temperature superconductors under external electromagnetic radiation. A staircase structure of Shapiro steps is found in the branching region. Its origin is related to the coupling between junctions and their switching from rotating to oscillating states. This conclusion is tested by detailed analysis of the IV -characteristics as for total stack and for each junction in the stack. IV -curves of junctions in the stack are compared with the average of time derivative of phase difference. Experimental observation of this staircase structure would give us a proof of coupling between junctions and a way for precise measurement of its value. Such investigations would be also useful for a diagnostic of Josephson junctions in the stack.