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arXiv:1405.3898

Shapiro Step on the rc-Branch in the IV-characteristic of a Josephson Junction with an LC-shunting

Yu. M. Shukrinov, I. R. Rahmonov, K. V. Kulikov, P. Seidel

Published May 15, 2014• 0 citations
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Abstract

The effect of external radiation on the phase dynamics of Josephson junctions shunted by an LC circuit is examined. It is shown that additional resonant circuit (rc) branches appear in the current voltage characteristics of the junctions when the Josephson frequency is equal to the frequency of the formed resonance circuit. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the rc-branch in comparison to the case of Josephson junction without shunt. The experimental implementation of these effects might give very important advantages for existing methods and technologies.

DOI
10.48550/arxiv.1405.3898

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The effect of external radiation on the phase dynamics of Josephson junctions shunted by an LC circuit is examined. It is shown that additional resonant circuit (rc) branches appear in the current voltage characteristics of the junctions when the Josephson frequency is equal to the frequency of the formed resonance circuit. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the rc-branch in comparison to the case of Josephson junction without shunt. The experimental implementation of these effects might give very important advantages for existing methods and technologies.
We study an effect of external radiation on the dynamics of Josephson junction shunted by an LC circuit. When the Josephson frequency is equal to the frequency of the circuit, additional stable resonant circuit branches appear in the IV -characteristic of the junction. The branches occur on the stable side of a narrow resonance peak, while the other peak side has a negative slope and is unstable. We show that the amplitude dependence of the Shapiro step width crucially changes when the Shapiro step is on the resonant circuit branch. These effects might give very important advantages for methods and technologies that exploit the response of Josephson junctions to microwave fields.
We have analyzed the phase dynamics and current–voltage characteristics of a Josephson junction shunted by an LC circuit. When the Josephson frequency ω J becomes equal to the natural frequency ωrc of the formed resonance circuit, the I–V curve acquires additional branches. We have studied the features of the rc branch and the superconducting circuit for different values of the resonance frequency. It is shown that the maximal superconducting current through the Josephson junction on the rc-branch depends on the resonance frequency and is determined by the closeness of the end point of the rc branch to the critical current. We have determined the dependence of the maximal superconducting current on the resonance frequency for different values of the dissipation parameters. The limiting value of the maximal superconducting current is independent (to within 1%) of the parameters of the system.
Abstract The method of numerical solution of equations is used within the resistive model to study the behavior of deviations of the current‒voltage characteristics of nonideal Josephson junctions from similar characteristics of ideal (standard) junctions. Nonideal Josephson junctions are those in which the current‒phase relation contains additional Josephson harmonics. The dependences of the amplitudes of current steps (Shapiro steps) on the power of external electromagnetic radiation is calculated. The shape of these dependences is shown to deviate from the corresponding dependences for ideal Josephson junctions. In addition, the paper examines the features of the occurrence of additional current steps on the current‒voltage characteristics of Josephson junctions and shows a possibility of their absence in the case of the presence of additional harmonics in the current‒phase relation. The obtained results prove that by analyzing the step structure of the current‒voltage characteristics it is possible to obtain information about the properties of Josephson junctions and superconductors that form them.
We theoretically demonstrate that in a nonhysteretic Josephson junction (JJ) with a $2\ensuremath{\pi}$ periodic supercurrent in the presence of radio-frequency (RF) radiation one or several low-lying Shapiro steps could be absent in the voltage-current (VI)(VI)(VI) characteristic. The effect exists at low RF power and at frequencies fff approximately ten times smaller than ${f}_{0}={I}_{c}{R}_{N}/{\mathrm{\ensuremath{\Phi}}}_{0}$ (where Ic{I}_{c}Ic​ is the critical current, RN{R}_{N}RN​ is the normal-state resistance of the Josephson junction, and ${\mathrm{\ensuremath{\Phi}}}_{0}$ is the magnetic flux quantum). The origin of the effect is related to the large differential resistance Rdiff=dV/dI{R}_{\mathrm{diff}}=dV/dIRdiff​=dV/dI near $I\ensuremath{\simeq}{I}_{c}$, which is significantly greater than the value predicted by the resistively capacitance shunted junction (RCSJ) model in the overdamped limit. Our theoretical results are supported by experiments on Nb/NbSi/Nb Josephson junctions with nonhysteretic VIVIVI curves, where we observe the absence of one or more low-lying Shapiro steps, depending on the frequency and power of the RF radiation.
An experimental investigation is made of the subharmonic Shapiro steps observed on the I-V curves of high-T c superconductor Josephson junctions and on the bias-voltage dependences of the rf noise and detector response when the junctions are subjected to external submillimeter radiation. Structures of this type are ordinarily described by a nonsinusoidal current-phase relation, which is why subharmonic steps appear. Numerical modeling of the processes occurring in a Josephson junction by means of a simple current-phase relation, as in the case of an SNS junction, gives good agreement with experiment. The width of the characteristic Josephson generation line of the junction was estimated on the basis of the noise dependences and the selective detector response. The width can be explained by taking into account the shot noise of the tunneling component of the conductivity. A model of the conductivity of a high-T c superconductor Josephson junction, consisting of a tunnel junction with microshorts possessing metallic conductivity, is discussed.
We investigate IV -characteristics of coupled Josephson junctions which model the intrinsic Josephson junctions in high temperature superconductors under external electromagnetic radiation. A staircase structure of Shapiro steps is found in the branching region. Its origin is related to the coupling between junctions and their switching from rotating to oscillating states. This conclusion is tested by detailed analysis of the IV -characteristics as for total stack and for each junction in the stack. IV -curves of junctions in the stack are compared with the average of time derivative of phase difference. Experimental observation of this staircase structure would give us a proof of coupling between junctions and a way for precise measurement of its value. Such investigations would be also useful for a diagnostic of Josephson junctions in the stack.