Trapped ions have proven to be effective quantum bits; but increasing electric field noise as traps are miniaturized limits gate fidelity and progress towards a large-scale quantum computer. Removing contamination from surfaces is important for noise suppression; but cleaning techniques like argon ion bombardment are difficult to integrate with current systems and are too harsh for traps incorporating optical devices. We investigate an alternative solution: a protective coating against surface contamination. We fabricate copper traps with a graphene passivation layer and characterize them with single ions. Surprisingly, we find worse noise performance than for an uncoated metal trap.
Trapped ions have proven to be effective quantum bits; but increasing electric field noise as traps are miniaturized limits gate fidelity and progress towards a large-scale quantum computer. Removing contamination from surfaces is important for noise suppression; but cleaning techniques like argon ion bombardment are difficult to integrate with current systems and are too harsh for traps incorporating optical devices. We investigate an alternative solution: a protective coating against surface contamination. We fabricate copper traps with a graphene passivation layer and characterize them with single ions. Surprisingly, we find worse noise performance than for an uncoated metal trap.
Electric field noise originating from metal surfaces is a hindrance for a variety of microengineered systems, including for ions in microtraps, but is not well understood at the microscopic level. For trapped ions, it is manifested as motional-state decoherence inexplicable by thermal noise of electrodes alone, but likely surface-dependent. Here, we investigate the role of surface properties in motional heating by creating an ion trap with a unique exterior. Using single trapped-ion probes, we characterize copper electrodes covered in monolayer graphene, a material free of surface charge and dangling bonds. Surprisingly, we measure an average heating rate of 1020 ± 30 quanta/s, which is ∼100 times higher than typical for an uncoated trap operated under similar conditions. This may be related to hydrocarbon deposits on the surface, which could be monitored on graphene to potentially elucidate the mechanisms of motional heating on the atomic scale.
Motional heating of trapped atomic ions is a major obstacle to their use as quantum bits in a scalable quantum computer. The detailed physical origin of this heating is not well understood, but experimental evidence suggests that it is caused by electric-field noise emanating from the surface of the trap electrodes. In this study, we have investigated the role of adsorbates on the electrodes by identifying contaminant overlayers, implementing an in situ argon-ion-beam cleaning treatment, and measuring ion heating rates before and after treating the trap electrodes' surfaces. We find a 100-fold reduction in heating rate after treatment. The experiments described here are sensitive to low levels of electric-field noise in the MHz frequency range. Therefore, this approach could become a useful tool in surface science that complements established techniques.
All surfaces generate electric-field noise, yet the physical origins of this noise are not well understood. This has been an active area of research in the ion trapping community for the past two decades, as ions are highly sensitive to electric-field fluctuations. With our work, we aim to illuminate the microscopic processes that drive charge dynamics on metal surfaces, so as to enable the engineering of low noise quantum devices. We use single trapped calcium ions as detectors to study the 1/f noise generated by the surfaces of ion traps. We the study this noise by observing how it responds to changes in the properties of the trap surface. The surface properties are altered using treatments including prolonged heating, argon ion milling, and electron bombardment. In situ characterization tools are used to monitor the effects of these treatments. Our measurements are consistent with noise produced by an ensemble of thermally activated fluctuators, so our data is discussed in this context. In this dissertation, we present results from a lengthy series of surface treatment experiments, the majority of which took place on a single aluminum-copper substrate. The results of these experiments indicate that argon ion milling can lower noise both by removing contaminants and by altering the morphology of the trap surface. The effects of morphology are isolated from the effects of contaminant removal via heat treatments, which alter the structure of the surface without changing its chemical composition. Through electron bombardment experiments, we begin an exploration of the relationship between hydrocarbon adsorbate structure and electric-field noise. In addition, we compare the noise characteristics of a set of similarly fabricated traps, and determine that atmosphere exposure has a major impact on noise produced by aluminum-copper films.These experiments establish links between the electric-field noise characteristics and the microscopic properties of a contaminated metal trap surface. The insights we draw in this work can inform the next generation of ion trap engineering, storage, and treatment.
We report room-temperature electric field noise measurements combined with in-situ surface characterization and cleaning of a microfabricated ion trap. We used a single-ion electric field noise sensor in combination with surface cleaning and analysis tools, to investigate the relationship between electric field noise from metal surfaces in vacuum and the composition of the surface. These experiments were performed in a novel setup that integrates ion trapping capabilities with surface analysis tools. We find that surface cleaning of an aluminum-copper surface significantly reduces the level of electric field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The post-cleaning noise levels are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap.
We use a single-ion electric-field noise sensor in combination with in situ surface treatment and analysis tools, to investigate the relationship between electric-field noise from metal surfaces in vacuum and the composition of the surface. These experiments are performed in a setup that integrates ion trapping capabilities with surface analysis tools. We find that treatment of an aluminum-copper surface with energetic argon ions significantly reduces the level of room-temperature electric-field noise, but the surface does not need to be atomically clean to show noise levels comparable to those of the best cryogenic traps. The noise levels after treatment are low enough to allow fault-tolerant trapped-ion quantum information processing on a microfabricated surface trap at room temperature.
While quantum information processing offers a tantalizing possibility of a significant speedup in execution of certain algorithms, as well as enabling previously unmanageable simulations of large quantum systems, it remains extremely difficult to realize experimentally. Recently, fundamental building blocks of a quantum computer, including one and two qubit gates, teleportation and error correction, were demonstrated using trapped atomic ions. Scaling to a larger number of qubits requires miniaturization of the ion traps, currently limited by the sharply increasing motional state decoherence at sub-100 μm ion-electrode distances. This thesis explores the source and suppression of this decoherence at cryogenic temperatures, and demonstrates fundamental logic gates in a surface electrode ion trap.
Construction of the apparatus requires the development of a number of experimental techniques. Design, numerical simulation and implementation of a surface electrode ion trap is presented. Cryogenic cooling of the trap to near 4 K is accomplished by contact with a bath cryostat. Ions are loaded by ablation or photoionization, both of which are characterized in terms of generated stray fields and heat load.
The bulk of new experimental results deals with measurements of electric field noise at the ion's position. Upon cooling to 6 K, the measured rates are suppressed by up to 7 orders of magnitude, more than two orders of magnitude below previously published data for similarly sized traps operated at room temperature. The observed noise depends strongly on fabrication process, which suggests further improvements are possible. The measured dependence of the electric field noise on temperature is inconsistent with published models, and can be explained using a continuous spectrum of activated fluctuators.
The fabricated surface electrode traps are used to demonstrate coherent operations and the classical control required for trapped ion quantum computation. The necessary spectral properties of coherent light sources are achieved with a novel design using optical feedback to a triangular, medium finesse, cavity, followed by electronic feedback to an ultra-high finesse reference cavity. Single and two qubit operations on a single ion are demonstrated with classical fidelity in excess of 95%. Magnetic field gradient coils built into the trap allow for individual addressing of ions, a prerequisite to scaling to multiple qubits. (Copies available exclusively from MIT Libraries, Rm. 14-0551, Cambridge, MA 02139-4307. Ph. 617-253-5668; Fax 617-253-1690.)