Experimental multi-photon entanglement and quantum enhanced metrology

Shigeki Takeuchi

Lorcán O. Conlon, Tobias Vogl, Christian D. Marciniak +9 more

Entanglement is a fundamental feature of quantum mechanics and holds great promise for enhancing metrology and communications. Much of the focus of quantum metrology so far has been on generating highly entangled quantum states that offer better sensitivity, per resource, than what can be achieved classically. However, to reach the ultimate limits in multi-parameter quantum metrology and quantum information processing tasks, collective measurements, which generate entanglement between multiple copies of the quantum state, are necessary. Here, we experimentally demonstrate theoretically optimal single- and two-copy collective measurements for simultaneously estimating two non-commuting qubit rotations. This allows us to implement quantum-enhanced sensing, for which the metrological gain persists for high levels of decoherence, and to draw fundamental insights about the interpretation of the uncertainty principle. We implement our optimal measurements on superconducting, trapped-ion and photonic systems, providing an indication of how future quantum-enhanced sensing networks may look.

Marco Genovese

Jiahao Huang, Min Zhuang, Chaohong Lee

Entanglement-enhanced quantum metrology explores the utilization of quantum entanglement to enhance measurement precision. When particles in a probe are prepared into a suitable quantum entangled state, they may collectively accumulate information about the physical quantity to be measured, leading to an improvement in measurement precision beyond the standard quantum limit and approaching the Heisenberg limit. The rapid advancement of techniques for quantum manipulation and detection has enabled the generation, manipulation, and detection of multi-particle entangled states in synthetic quantum systems such as cold atoms and trapped ions. This article aims to review and illustrate the fundamental principles and experimental progresses that demonstrate multi-particle entanglement for quantum metrology, as well as discuss the potential applications of entanglement-enhanced quantum sensors.

Ashley Lyons

Madhura Ghosh Dastidar, Aprameyan Desikan, Vidya Praveen Bhallamudi

Quantum metrology aims at achieving enhanced performance in measuring unknown parameters by utilizing quantum resources. Thus, quantum metrology is an important application of quantum technologies. Photonic systems can implement these metrological tasks with simpler experimental techniques. We present a scheme for improved parameter estimation by introducing entangled generalized coherent states (EGCS) for photonic quantum metrology. These states show enhanced sensitivity beyond the classical and Heisenberg limits and prove to be advantageous as compared to the entangled coherent and NOON states. Further, we also propose a scheme for experimentally generating certain entangled generalized coherent states with current technology.