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Lecture notes in physics

Photonic Quantum Metrologies Using Photons: Phase Super-sensitivity and Entanglement-Enhanced Imaging

Shigeki Takeuchi

Published Dec 29, 2015• 0 citations
Publisher
DOI
10.1007/978-4-431-55756-2_7

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We investigate the resolution for imaging two pointlike entangled sources by using the method of moments and spatial-mode demultiplexing, where the pointlike entangled sources can be generated by injecting single-mode sources with arbitrary quantum statistics distribution into an optical parametric amplifier (OPA). We demonstrate that the separation estimation sensitivity is mainly determined by the photon distribution in each detected mode and it can be enhanced by either increasing the squeezed parameter of the OPA or eliminating the relative phase difference of the entangled sources. Furthermore, in the limiting case of infinitely small source separation, the usage of entangled sources can have better resolution than those using incoherent and coherent sources. The results here can find important applications for quantum super-resolution imaging and quantum metrology.
Quantum techniques are commonly used to enhance measurement performance in many fields, such as imaging, microscopy, communications, computing and metrology. In quantum imaging and microscopy, entangled photons are exploited to improve image resolution and sensitivity, overcoming the diffraction limit and providing Sub-Shot Noise (SSN) measurements [1] . Super resolution imaging, SSN imaging, quantum-enhanced displacement sensing, correlation plenoptic imaging and ghost imaging are different quantum techniques used to enhance image quality. All them require time-resolved single-photon detectors, capable to detect photon coincidences with sub-nanosecond precision.