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arXiv:2305.10377

Using Entangled Generalized Coherent States for Photonic Quantum Metrology

Madhura Ghosh Dastidar, Aprameyan Desikan, Vidya Praveen Bhallamudi

Published May 17, 2023• 0 citations
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Abstract

Quantum metrology aims at achieving enhanced performance in measuring unknown parameters by utilizing quantum resources. Thus, quantum metrology is an important application of quantum technologies. Photonic systems can implement these metrological tasks with simpler experimental techniques. We present a scheme for improved parameter estimation by introducing entangled generalized coherent states (EGCS) for photonic quantum metrology. These states show enhanced sensitivity beyond the classical and Heisenberg limits and prove to be advantageous as compared to the entangled coherent and NOON states. Further, we also propose a scheme for experimentally generating certain entangled generalized coherent states with current technology.

DOI
10.48550/arxiv.2305.10377

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Quantum metrology aims at achieving enhanced performance in measuring unknown parameters by utilizing quantum resources. Thus, quantum metrology is an important application of quantum technologies. Photonic systems can implement these metrological tasks with simpler experimental techniques. We present a scheme for improved parameter estimation by introducing entangled generalized coherent states (EGCS) for photonic quantum metrology. These states show enhanced sensitivity beyond the classical and Heisenberg limits and prove to be advantageous as compared to the entangled coherent and NOON states. Further, we also propose a scheme for experimentally generating certain entangled generalized coherent states with current technology.
Quantum metrology is one of the most promising applications of quantum technologies. The aim of this research field is the estimation of unknown parameters exploiting quantum resources, whose application can lead to enhanced performances with respect to classical strategies. Several physical quantum systems can be employed to develop quantum sensors, and photonic systems represent ideal probes for a large number of metrological tasks. Here, the authors review the basic concepts behind quantum metrology and then focus on the application of photonic technology for this task, with particular attention to phase estimation. The authors describe the current state of the art in the field in terms of platforms and quantum resources. Furthermore, the authors present the research area of multiparameter quantum metrology, where multiple parameters have to be estimated at the same time. The authors conclude by discussing the current experimental and theoretical challenges and the open questions toward implementation of photonic quantum sensors with quantum-enhanced performances in the presence of noise.
Quantum mechanics allows entanglement enhanced measurements to be performed, but loss remains an obstacle in constructing realistic quantum metrology schemes. However, recent work has revealed that entangled coherent states (ECSs) have the potential to perform robust subclassical measurements [J. Joo et al., Phys. Rev. Lett. 107, 083601 (2011)]. Up to now no read-out scheme has been devised that exploits this robust nature of ECSs, but we present here an experimentally accessible method of achieving precision close to the theoretical bound, even with loss. We show substantial improvements over unentangled classical states and highly entangled NOON states for a wide range of loss values, elevating quantum metrology to a realizable technology in the near future.
The quantum Fisher information and quantum correlation parameters are employed to study the application of nonclassical light to the problem of parameter estimation. It is shown that the optimal measurement sensitivity of a quantum state is determined by its intermode correlations (which depends on path entanglement) and intramode correlations (which depends on the photon statistics). In light of these results, we consider the performance of quantum-enhanced optical interferometers. Furthermore, we propose a Heisenberg-limited metrology protocol involving standard elements from passive and active linear optics, for which the quantum Cram\'er-Rao bound is saturated with an intensity measurement. Interestingly, the quantum advantage for this scheme is derived solely from the nonclassical photon statistics of the probe state and does not depend on entanglement. We study the performance of this scheme in the presence of realistic losses and consequently predict a substantial enhancement over the shot-noise limit with current technological capabilities.
Quantum measurements have been intensively researched over decades due to quantum advantage of Heisenberg limit beating the standard quantum limit toward potential applications of quantum metrology. The kernel of quantum measurements is in the quantum correlation between bipartite photon pairs or squeezed light quenched by one parameter over corresponding noncommuting variable satisfying Heisenberg uncertainty principle. As a result, quantum measurements bring a quantum gain of the square root law in measurement sensitivity. Photonic de Broglie waves (PBW) have been the key feature of such a gain in quantum metrology especially for phase resolution enhancement beyond the classical limit of Rayleigh criterion or simply the diffraction limit. Due to extremely low efficiency of higher-order entangled photon pair generations such as a NOON state, however, the implementation of PBW for quantum metrology has been severely limited. Here, a completely different mechanism of quantum measurements is introduced for a new type of PBW and presented for its potential application of a modified Sagnac interferometer, where the resolution enhancement is several orders of magnitude higher than its classical counterpart.
Entanglement-enhanced quantum metrology explores the utilization of quantum entanglement to enhance measurement precision. When particles in a probe are prepared into a suitable quantum entangled state, they may collectively accumulate information about the physical quantity to be measured, leading to an improvement in measurement precision beyond the standard quantum limit and approaching the Heisenberg limit. The rapid advancement of techniques for quantum manipulation and detection has enabled the generation, manipulation, and detection of multi-particle entangled states in synthetic quantum systems such as cold atoms and trapped ions. This article aims to review and illustrate the fundamental principles and experimental progresses that demonstrate multi-particle entanglement for quantum metrology, as well as discuss the potential applications of entanglement-enhanced quantum sensors.