SUB-PICOSECOND MEASUREMENT OF TIME INTERVALS USING SINGLE ELECTRONICS
Peter A. Rosenthal
Abstract
A single flux quantum (SFQ) pulse coincidence detector based on resistively shunted nonhysteretic Josephson junctions was designed and simulated. The coincidence detector generates an SFQ pulse when the delay between the arrival of SFQ pulses at its two inputs is less than the coincidence threshold. Simulations indicate that the minimum coincidence threshold time can be as short as 400 f 200 fs assuming Josephson junction characteristic voltages of 1 mV, overdamped dynamics and 4.2 K operating temperatures. Circuit architectures exploiting this gate are suggested. Estimates of the effects of thermal noise on resolution are presented indicating the potential for various time domain measurements with sub-picosecond resolution. I. INTRODUCTION The high speed properties of Josephson electronics offer unique possibilities for high time resolution metrology1 such as fast sampling, A-to-D conversion?^^ race arbiting? and time domain reflectometry5 In this paper I propose an ap- proach to time interval measurement that is based on a simple circuit consisting of several overdamped Josephson junctions. This circuit uses the picosecond pulses of Josephson junctions in a simple way that can be integrated naturally into a fre- quency vernier measurement apparatus? A junction with a nonhysteretic resistively shunted current-voltage characteristic can be induced to generate voltage pulses whose time integral is equal to the elementary flux quantum @pg = 2.07 mV-p~.~ In particular, the pulse width from an overdamped Josephson junction with a characteristic voltage VC = IcR~ is given by At = Q)/ VC and can be as short as 2 ps for a junction with a typical VC = 1 mV. The short widths of SFQ pulses combined with the high plasma frequencies possible with overdamped junctions can be exploited in a simple circuit that detects pulse coincidence from two inputs and has a coincidence threshold that can be as short as several hundred femtoseconds for junction IcR~ products around 1 mV. In the next section of this paper I describe the coincidence detection circuit operation, including the results of simulations estimating the potential- performance characteristics. The ef- fects of thermal fluctuations on resolution will be discussed. In Section I11 a time interval measurement system is de- scribed, based on the frequency vernier interpolation method. Using conventional electronics, the vernier method has at- tained time interval resolution limits of about 20 ps.* Our simulations show in principle that a carefully designed fre-