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Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

Bistable vertical cavity laser as a truly random number generator

Viacheslav N. Chizhevsky, D. B. Horoshko, D. I. Pustakhod, S. Ya. Kilin

Published Jun 1, 2007• 1 citation
Publisher

Abstract

In this report we present a comprehensive statistical analysis of experimentally measured time intervals between spontaneous polarization switchings in a bistable VCSEL from standpoint of a possibility to generate random numbers. We propose an effective and robust algorithm of conversion of residence times into truly random binary numbers. This algorithm allows one to avoid the problem of biasing in the output bit stream as well as to obtain low correlation between bits.

DOI
10.1109/cleoe-iqec.2007.4385929

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In this report we present a comprehensive statistical analysis of experimentally measured time intervals between spontaneous polarization switchings in a bistable VCSEL from standpoint of a possibility to generate random numbers. We propose an effective and robust algorithm of conversion of residence times into truly random binary numbers. This algorithm allows one to avoid the problem of biasing in the output bit stream as well as to obtain low correlation between bits.
An effective and robust method for generating random bits from random time intervals between quantum jumps of optical field is proposed and experimentally tested with spontaneous switchings in a bistable vertical-cavity surface-emitting laser. This algorithm allows one to avoid the problem of biasing in the output bit stream as well as to obtain low correlation between generated bits. A comprehensive comparative statistical analysis of different methods of extraction of random bits from experimentally measured time intervals between spontaneous polarization switchings in a bistable vertical-cavity surface-emitting laser shows the advantage of the proposed method.
Random numbers are essential in a great variety of applications ranging from stochastic simulations to secure communications. In this thesis, we report a technique for quantum random number generation based on the dynamics of light polarization in a vertical-cavity surface-emitting laser (VCSEL). We show that two linearly polarized modes with slightly different wavelengths and gains appear within the cavity of the VCSEL laser. Due to spontaneous emission noise, VCSELs undergo random polarization switching at certain bias currents. We experimentally analyze the probability of appearance of each mode as a function of the biasing conditions. By periodically modulating a VCSEL at the polarization switching region defined under continuous-wave operation, random digits can be generated directly from the output of the pulsed VCSEL at a much higher bit rate. The results presented in this research demonstrate the feasibility of generating random numbers at rates up to 100 Mbit/s using a commercial VCSEL.
We have experimentally demonstrated that the random excitation of the linear orthogonal polarization modes of a gain-switched vertical-cavity surface-emitting laser (VCSEL) can be used for quantum random number generation. Our VCSEL presents polarization switching under continuous wave operation. Adjusting the modulation conditions and sampling times, both polarization modes of the VCSEL can be excited with equal probability. Random bits are obtained comparing the two orthogonal polarized signals at a sampling time. The random bits obtained pass some of the National Institute of Standards and Technology (NIST) statistical tests.
We experimentally study a quantum random number generator based on the random excitation of the linearly polarized modes of a gain-switched vertical-cavity surface-emitting laser (VCSEL). Our device is characterized by having polarization switching under continuous wave operation. By measuring the linear polarization mode that is excited in each pulse we collect a sufficient number of bits to evaluate if a standard statistical test suite is passed. We consider linear and Von Neumann post-processing methods in order to reduce the bias with different levels of bits rejection. The post-processed bit strings pass all tests in the standard test suite for random number generators provided by the National Institute of Standards and Technology (NIST). We finally compare the results obtained with different post-processing functions, including several [ n , k , d ] linear BCH codes. We show that large values of n and k are the best choice to obtain simultaneously improved throughput and randomness.