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International Conference Laser Optics (ICLO)

200 Mbps real-time true random bit generator based on polarization noise in a VCSEL

Viacheslav N. Chizhevsky, А. С. Малоштан, A. V. Glejm

Published Jun 1, 2014• 0 citations
Publisher

Abstract

Summary form only given: We report a prototype of real-time physical true random bit generator based on a polarization noise in a vertical-cavity surface-emitting laser (VCSEL) with a bit rate more than 200 Mbps. A comprehensive statistical analysis of bits sequences performed by means of three standard tests of randomness (ENT, Diehard and NIST) shows a high quality of generated random bit sequences.

DOI
10.1109/lo.2014.6886286

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Summary form only given: We report a prototype of real-time physical true random bit generator based on a polarization noise in a vertical-cavity surface-emitting laser (VCSEL) with a bit rate more than 200 Mbps. A comprehensive statistical analysis of bits sequences performed by means of three standard tests of randomness (ENT, Diehard and NIST) shows a high quality of generated random bit sequences.
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We propose an implementation of random number generation based on the measurement of polarization mode noise in vertical-cavity surface-emitting lasers (VCSEL). By measuring the phase difference between two laser beams with perpendicular polarization directions, a 40 Gbps generation speed is achieved with a simple post-processing method. The random sequence we generated passes both the standard statistical test suites (Diehard and NIST-STS) and 3σ criterion. Our setup is compact and easy for implementation, and it also has a better efficiency in extracting randomness from VCSEL compared with existing methods.
It is experimentally demonstrated that intensity fluctuations on a selected polarization in a semi-conductor vertical-cavity laser are an effective source of entropy for fast generation of random bits. The effective generation rate is shown to be from 100 Mbps to 4.5 Gbps at the discretization frequency of 100 MHz, depending on how the random bits are extracted from the polarization noise. The generated sequences of random bits are characterized by low bias and absence of correlation between bits and successfully pass main statistical randomness tests.
Random numbers are essential in a great variety of applications ranging from stochastic simulations to secure communications. In this thesis, we report a technique for quantum random number generation based on the dynamics of light polarization in a vertical-cavity surface-emitting laser (VCSEL). We show that two linearly polarized modes with slightly different wavelengths and gains appear within the cavity of the VCSEL laser. Due to spontaneous emission noise, VCSELs undergo random polarization switching at certain bias currents. We experimentally analyze the probability of appearance of each mode as a function of the biasing conditions. By periodically modulating a VCSEL at the polarization switching region defined under continuous-wave operation, random digits can be generated directly from the output of the pulsed VCSEL at a much higher bit rate. The results presented in this research demonstrate the feasibility of generating random numbers at rates up to 100 Mbit/s using a commercial VCSEL.
We have experimentally demonstrated that the random excitation of the linear orthogonal polarization modes of a gain-switched vertical-cavity surface-emitting laser (VCSEL) can be used for quantum random number generation. Our VCSEL presents polarization switching under continuous wave operation. Adjusting the modulation conditions and sampling times, both polarization modes of the VCSEL can be excited with equal probability. Random bits are obtained comparing the two orthogonal polarized signals at a sampling time. The random bits obtained pass some of the National Institute of Standards and Technology (NIST) statistical tests.
We experimentally study a quantum random number generator based on the random excitation of the linearly polarized modes of a gain-switched vertical-cavity surface-emitting laser (VCSEL). Our device is characterized by having polarization switching under continuous wave operation. By measuring the linear polarization mode that is excited in each pulse we collect a sufficient number of bits to evaluate if a standard statistical test suite is passed. We consider linear and Von Neumann post-processing methods in order to reduce the bias with different levels of bits rejection. The post-processed bit strings pass all tests in the standard test suite for random number generators provided by the National Institute of Standards and Technology (NIST). We finally compare the results obtained with different post-processing functions, including several [ n , k , d ] linear BCH codes. We show that large values of n and k are the best choice to obtain simultaneously improved throughput and randomness.