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IEEE Transactions on Applied Superconductivity

Thermal noise in digital Josephson devices

J.D. Feder, M. Klein, C.J. Anderson

Published Mar 1, 1993• 4 citations
Publisher

Abstract

A method of accurately estimating the I/sub 0/ (critical current) of a Josephson junction (JJ) with thermal noise was developed by measuring the effective thermal noise temperature of a JJ. The effective thermal noise temperature of various JJ devices was measured and calculated. The JJ devices evaluated included inductively and resistively coupled logic devices and JJ devices in the presence of various noise sources. The noise sources included room-temperature resistors, switched JJ devices, and JJ devices in the linear I-V region beyond the gap. The R/sub NN/ compensator is shown to result in a noise temperature of about 6 K at an interferometer. The addition of a shunt junction lessens the noise penalty introduced by the compensator. A switched isolation interferometer in a two-input AND gate contributes negligible noise at the injection device. It is also shown that bandwidth connections to room-temperature equipment result in very large excess noise and require special input and output circuits on the chip.>

DOI
10.1109/77.233509

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Applied Physics Letters•Apr 15, 1982•37 citations
A method of accurately estimating the I/sub 0/ (critical current) of a Josephson junction (JJ) with thermal noise was developed by measuring the effective thermal noise temperature of a JJ. The effective thermal noise temperature of various JJ devices was measured and calculated. The JJ devices evaluated included inductively and resistively coupled logic devices and JJ devices in the presence of various noise sources. The noise sources included room-temperature resistors, switched JJ devices, and JJ devices in the linear I-V region beyond the gap. The R/sub NN/ compensator is shown to result in a noise temperature of about 6 K at an interferometer. The addition of a shunt junction lessens the noise penalty introduced by the compensator. A switched isolation interferometer in a two-input AND gate contributes negligible noise at the injection device. It is also shown that bandwidth connections to room-temperature equipment result in very large excess noise and require special input and output circuits on the chip.>
To measure the effect of thermal noise on switching a Josephson junction to the voltage state a simple SFQ circuit constructed with resistively shunted Nb/AlO/sub x//Nb junctions was used. Based on a good agreement between the measured data and the thermal activation theory, the effect of thermal noise on the bit error rate of SFQ devices was studied, The effective thermal noise temperature of 10 K used to fit the data was higher than the bath temperature of 4.2 K. Careful circuit design to get large critical margins is necessary to achieve high operating temperature of SFQ logic devices.
In the design of electronic applications (for example, rapid single flux quantum (RSFQ) circuits), the properties of Josephson junctions (JJs) provided by technology are the major requirement. The characteristic voltage IcRn an dt he dynamic parameter βc are non-negligibly important, bu tt he external shunted junctions are only completely described by including the parasitic inductance between the junction area and the shunt resistor. The first publications of the RSFQ circuit technique were closely followed by many studies on the dynamic influence of this inductance. It has been pointed out that no practical value of this parameter has to be taken into account in the circuit design and optimization process. The operation of RSFQ logic circuits made of high-temperature superconductors (HTS) are strongly influenced by thermal noise. Our paper contains the determination of the digital bit-error rate for all different types of JJs by using a Fokker–Planck equation for describing the influence of thermal fluctuations. Ou ra nalysis shows that the parasitic inductance cannot be neglected in terms of noise. The intrinsic shunted junctions like high current density-, SINIS- and all kinds of HTS-JJs provide the best noise immunity for a fixed temperature.
The use of high-T/sub c/ Josephson junctions for digital applications requires a careful study of the influence of thermal noise on circuit performance. We investigated a balanced current comparator, which contains a basic component of all RSFQ circuits: two overdamped Josephson junctions connected in series. The dependence of the dc-voltage across the Josephson junctions on signal current was measured to determine the threshold uncertainty of switching of the comparator. The experimental data obtained at different sampling pulse frequencies, in a temperature range from 10 to 50 K, were compared with a theoretical model, taking into account the influence of thermal noise as well as of sampling pulse frequency.
Josephson effect mixers have previously been observed to display 'excess' noise both in experiments with point contacts and in numerical simulations using the resistively shunted junction (RSJ) model. This excess noise causes the mixer noise temperature to be a factor of typically 20-100 times the physical temperature of the device. Previously, this excess was ascribed to conversion from unwanted sidebands of the local oscillator and Josephson frequencies and their harmonics. Our numerical modeling of the RSJ equations has led to a new understanding of the excess noise, which is simply due to the intrinsic Josephson oscillations of the device. In addition, we have extended the modeling to include the previously ignored case of finite device capacitance (i.e. RSJ capacitance parameter beta(sub c) does not equal 0, which is more realistic for lithographically defined Josephson such as shunted tunnel junctions or SNS bridges. For some cases, this yields an improvement of a factor of two in noise temperature from the zero capacitance models. We will discuss the device parameters which optimize the mixer performance for frequencies approaching the characteristic frequency of the device, which is given by the Josephson frequency at the I(sub c)R(sub n) voltage (nu = 2eI(sub c)R(sub n)/h). These modeling results predict good conversion efficiency and a noise temperature within a factor of a few of the physical temperature. Experiments are in progress to determine the accuracy of this modeling using a waveguide mixer at 100 GHz with optimized, resistively shunted Nb tunnel junctions. If the modeling results are valid, they are particularly encouraging for mixers in the submillimeter regime, given the possibility of obtaining non-hysteretic Josephson devices with I(sub c)R(sub n) products in excess of a millivolt, using for instance, high-T(sub c) SNS bridges. We discuss the modifications to the classical RSJ model which are necessary in the quantum regime (h nu greater than kT), and conclude the Josephson mixers may attain noise temperatures less than ten times the quantum limit at high frequencies.
The impedance and noise of a resistive superconductive quantum interference device (R-SQUID) have been measured as a function of the dc and rf currents applied to it. The Josephson junction was adjustable so that data were also taken for several values of the junction critical current. The results were compared with the predictions of a resistively shunted junction (RSJ) model which takes into account the influence of the Josephson junction on the impedance and noise. The agreement was found to be quite good and demonstrates that the noise in the circuit is well understood. Use of the R-SQUID as a noise thermometer below 1 K is assessed in terms of corrections due to the RSJ model. It is demonstrated how the dc and rf currents may be adjusted so that the total noise of the R-SQUID is reduced to within 0.1% of the Johnson noise generated by the resistor alone. Under these conditions, the R-SQUID may be used as a noise thermometer to determine thermodynamic temperature to this inaccuracy from 6 to 700 mK.
Thermal noise induced switching of Josephson logic devices is studied, both theoretically and experimentally. The results are critical for the design of the operating bias points for these devices. An analysis of the relevant energy contours shows that a three-junction superconducting quantum interference device has the same noise switching rate as a point junction with the same maximum critical current. Experimental results, for the dependence of the thermal noise induced switching rate on the gate current bias ratio, are in very good agreement with the theory.