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Applied Physics Letters

Current-induced vortex unbinding in bolometer mixers

R. Barends, Merlijn Hajenius, J. R. Gao, T. M. Klapwijk

Published Dec 23, 2005• 39 citations
Publisher

Abstract

We present a description of the current-voltage characteristics of hot electron bolometers in terms of the current-dependent intrinsic resistive transition of NbN films. We find that, by including this current dependence, we can correctly predict the complete current-voltage characteristics, showing excellent agreement with measurements for both low and high bias and for small as well as large devices. It is assumed that the current dependence is due to vortex-antivortex unbinding as described in the Berezinskii–Kosterlitz–Thouless theory. The presented approach will be useful in guiding device optimization for noise and bandwidth.

DOI
10.1063/1.2158510

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Softwaretechnik-Trends•Mar 1, 1996•21 citations
We present a description of the current-voltage characteristics of hot electron bolometers in terms of the current-dependent intrinsic resistive transition of NbN films. We find that, by including this current dependence, we can correctly predict the complete current-voltage characteristics, showing excellent agreement with measurements for both low and high bias and for small as well as large devices. It is assumed that the current dependence is due to vortex-antivortex unbinding as described in the Berezinskii–Kosterlitz–Thouless theory. The presented approach will be useful in guiding device optimization for noise and bandwidth.
Phonon cooled hot electron bolometers (HEB) show smaller noise temperatures in mixer applications above 1THz compared to Schottky diodes or SIS devices. To determine the optimal bias point for maximum IF bandwidth and lowest noise of a FEB detailed understandin g of the current-voltage characteristic is indispensable. A complete nonlinear model for a hot electron bolometric (HEB) mixer is derived. The dynamic resistance of a superconducting film is calculated under stron g demagnetization conditions. The resistance is modeled due to vortex flow and phase slip lines. Self heating gives rise to normal domains in the film. In addition the resistance due to thermally activated flux creep and thermal fluctuations is taken into account. All these relations form a large si gnal model for the iv-characteristics and the bias points of the device. A small signal linearization yields then conversion gain and noise temperatures. Furthermore a quality measure for HEB devices is set up by deriving the thermal coupling of the film to the substrate and the achieved critical current density from measured current-voltage characteristics.
Hot-electron bolometer devices, used successfully in low noise heterodyne mixing at frequencies up to 2.5 THz, have been analyzed. A distributed temperature numerical model of the NbN bridge, based on a local electron and a phonon temperature, is used to model pumped IV curves and understand the physical conditions during the mixing process. We argue that the mixing is predominantly due to the strongly temperature dependent local resistivity of the NbN. Experimentally we identify the origins of different transition temperatures in a real HEB device, suggesting the importance of the intrinsic resistive transition of the superconducting bridge in the modeling.
We present a physically consistent interpretation of the dc electrical properties of niobiumnitride (NbN)-based superconducting hot-electron bolometer mixers, using concepts of nonequilibrium superconductivity. Through this, we clarify what physical information can be extracted from the resistive transition and the dc current-voltage characteristics, measured at suitably chosen temperatures, and relevant for device characterization and optimization. We point out that the intrinsic spatial variation of the electronic properties of disordered superconductors, such as NbN, leads to a variation from device to device.
A theoretical analysis for the noise temperature of hot—electron superconducting mixer has been presented. The contributions of both Johnson noise and electron temperature fluctuations have been evaluated. A set of criteria ensuring low noise performance of the mixer has been stated and a simple analytic expression for the noise temperature of the mixer device has been suggested. It has been shown that an improvement of the mixer sensitivity does not necessarily follow by a decrease of the bandwidth. An SSB noise temperature limit due to the intrinsic noise mechanisms has been estimated to be as low as 40-90 K for a mixer device made from Nb or NbN thin film. Furthermore, the conversion gain bandwidth can be as wide as is allowed by the intrinsic electron temperature relaxation time if an appropriate choice of the mixer resistance has been made. The intrinsic mixer noise bandwidth is of 3 GHz for Nb device and of 5 GHz for NbN device. An additional improvement of the theory has been made when a distinction between the impedance measured at high intermediate frequency (larger than the mixer bandwidth) and the mixer ohmic resistance has been taken into account. Recently obtained experimental data on Nb and NbN bolometer mixer devices are viewed in connection with the theoretical predictions. The noise temperature limit has also been specified for the mixer device where an outdiffusion cooling mechanism rather than the electron—phonon energy relaxation determines the mixer bandwidth. A consideration of the noise performance of a bolometer mixer made from YBaCuO film utilizing a hot—electron effect has been done.
The bandwidth of NbN phonon-cooled hot electron bolometer mixers has been systematically investigated with respect to the film thickness and film quality variation. The films, 2.5 to 10 nm thick, were fabricated on sapphire substrates using DC reactive magnetron sputtering. All devices consisted of several parallel strips, each 1 μ wide and 2 μ long, placed between Ti-Au contact pads. To measure the gain bandwidth we used two identical BWOs operating in the 120-140 GHz frequency range, one functioning as a local oscillator and the other as a signal source. The majority of the measurements were made at an ambient temperature of 4.2 K with optimal LO and DC bias. The maximum 3 dB bandwidth (about 4 GHz) was achieved for the devices made of films which were 2.5-3.5 nm thick, had a high critical temperature, and high critical current density. A theoretical analysis of bandwidth for these mixers based on the two-temperature model gives a good description of the experimental results if one assumes that the electron temperature is equal to the critical temperature.
We present theoretical analysis of the performance of a superconducting hot-electron bolometer mixer with electron cooling due to electron phonon interaction. The analysis is based on a complete set of thermal balance equations for phonons and electrons. A non-thermal action of a dc current has been considered phenomenologically using an analytical fit of isothermal current-voltage characteristics of the mixer. The operation point of the mixer has been determined as a result of the heating by both the power of a local oscillator and the power dissipated by the current. Electron temperature fluctuations, Nyquist noise, and shot noise have been supposed to only contribute to the mixer noise. The conversion gain and the noise temperature of the mixer have been evaluated taking into account an electro-thermal feedback between the mixer and an intermediate frequency circuit with an arbitrary impedance. We have obtained general expressions for the conversion gain, noise temperature and impedance which enabled us to estimate ultimate performance of a superconducting hot-electron bolometer mixer. Theoretical predictions are in good agreement with experimental results obtained for a NbN hot-electron bolometer mixer at a radiation frequency of 2.5 THz.