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Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Extending classical test to quantum

Jacob Biamonte, Minki Jeong, Jae‐Seung Lee, Marek A. Perkowski

Published May 23, 2005• 3 citations
Publisher

Abstract

We first introduce a method called quantum path verification, where we search for a break in a quantum network. After explaining these capabilities, we address gate internal faults. We present new fault models to represent crosstalk and unwanted nearest neighbor entanglement. When witnessed, these errors are probabilistic, but there is a set of tests that has the highest probability of detecting a fault. We introduce a method of probabilistic set covering to identify this set of tests. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies.

DOI
10.1117/12.623715

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We first introduce a method called quantum path verification, where we search for a break in a quantum network. After explaining these capabilities, we address gate internal faults. We present new fault models to represent crosstalk and unwanted nearest neighbor entanglement. When witnessed, these errors are probabilistic, but there is a set of tests that has the highest probability of detecting a fault. We introduce a method of probabilistic set covering to identify this set of tests. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies.
This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks. Faculty Mentor: Marek A. Perkowski
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A fault table is created that includes probabilistic information. "Probabilistic set covering" and "probabilistic adaptive trees" that generalize those known in standard circuits, are next used.
Abstract This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set generation technique known as constructing a fault table is given. This classical technique optimizes test plans to detect all the most common error types. This work therefore considers the set of predominate errors modeled by unwanted qubit rotations. In classical test, a fault table is constructed allowing the comparison between a circuit’s nominal response and a response perturbed by each separately considered error. It was found that isolating a correct circuit from a circuit containing any of the Pauli Fault rotations, requires applications of just two independent test vectors. This is related to the proven fact that a reversible system preserves the probability that additional information may be present. Thus, the probability of detection for an observable fault is related only to the probability of presence. A theorem that better connects classical ideas to quantum test set generation is presented. This leads directly to a relationship between the deterministic presence of a fault in the state vector observed with some probability and the probabilistic presence of a fault observed deterministically (Relating Time and Space Error Models). 1
A new approach to detecting and diagnosing faults in quantum circuits is introduced. In order to account for the probabilistic nature of quantum circuits, collections of test experiments, called binary tomographic tests (BTTs), are generated. A BTT can identify a fault with respect to some user-defined confidence threshold τ. We present an algorithm to generate BTTs that either detect, or ensure the absence of, all modeled faults in a given circuit. We also present an adaptive diagnostic method to locate quantum faults. While classical circuits, even probabilistic ones, only handle ordinary probabilities, quantum circuits deal with quantum states, which have phase as an extra probabilistic parameter. The tomographic testing methods introduced previously for probabilistic circuits are unable to detect differences in phase, and therefore leave many quantum faults undetected. In contrast, we develop a design-for-test method which is specifically intended to detect faults that only affect the phase of a quantum state. We give experimental results for benchmark and random circuits which show high coverage of quantum faults by BTTs, and good resolution in the case of the adaptive diagnosis method.
It is shown that the fault testing for quantum circuits does not follow conventional classical techniques. If probabilistic gate like Hadamard gate is included in a circuit then the classical notion of test vector is shown to fail. We have reported several new and distinguishing features of quantum fault and also presented a general methodology for detection of functional faults in a quantum circuit. The technique can generate test vectors for detection of di erent kinds of fault. Speci c examples are given and time complexity of the proposed quantum fault detection algorithm is reported. 1
Detection and isolation of faults is a crucial step in the physical realization of quantum circuits. Even though quantum gates and circuits compute reversible functions, the standard techniques of automatic test pattern generation (ATPG) for classical reversible circuits are not directly applicable to quantum circuits. For faulty quantum circuits under the widely accepted single fault assumption, we show that their behavior can be fully characterized by the (single) faulty gate and the corresponding fault model. This allows us to efficiently determine test input states as well as measurement strategy for fault detection and diagnosis. Building on top of these, we design randomized algorithms which are able to detect every nontrivial single-gate fault with minimal probability of error. We also describe similar algorithms for fault diagnosis. We evaluate our algorithms by the number of output samples that needs to be collected and the probability of error. Both of these can be related to the eigenvalues of the operators corresponding to the circuit gates. We experimentally compare all our strategies with the state-of-the-art ATPG techniques for quantum circuits under the “single missing faulty gate” model and demonstrate that significant improvement is possible if we can exploit the quantum nature of circuits.