PSU McNair Scholars Online Journal

Automated Test Pattern Generation for Quantum Circuits

Jacob Biamonte

Published Jan 1, 2005• 3 citations

Abstract

This work extends a general method used to test classical circuits to quantum circuits. Gate internal errors are address using a discrete fault model. Fault models to represent unwanted nearest neighbor entanglement as well as unwanted qubit rotation are presented. When witnessed, the faults we model are probabilistic, but there is a set of tests with the highest probability of detecting a discrete repetitive fault. A method of probabilistic set covering to identify the minimal set of tests is introduced. A large part of our work consisted of writing a software package that allows us to compare various fault models and test strategies for quantum networks. Faculty Mentor: Marek A. Perkowski

DOI: 10.15760/mcnair.2005.38

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