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Physical Review Letters

Critical Petermann K Factor for Intensity Noise Squeezing

A. M. van der Lee, N. J. van Druten, Martin P. van Exter, J. P. Woerdman, J.-Ph. Poizat, Philippe Grangier

Published Nov 27, 2000• 22 citations
Publisher

Abstract

We investigate the impact of the Petermann-excess-noise factor K>/=1 on the possibility of intensity noise squeezing of laser light below the standard quantum limit. Using an N-mode model, we show that squeezing is limited to a floor level of 2(K-1) times the shot noise limit. Thus, even a modest Petermann factor significantly impedes squeezing, which becomes impossible when K>/=1.5. This appears as a serious limitation for obtaining sub-shot-noise light from practical semiconductor lasers. We present experimental evidence for our theory.

DOI
10.1103/physrevlett.85.4711

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We investigate the impact of the Petermann-excess-noise factor K>/=1 on the possibility of intensity noise squeezing of laser light below the standard quantum limit. Using an N-mode model, we show that squeezing is limited to a floor level of 2(K-1) times the shot noise limit. Thus, even a modest Petermann factor significantly impedes squeezing, which becomes impossible when K>/=1.5. This appears as a serious limitation for obtaining sub-shot-noise light from practical semiconductor lasers. We present experimental evidence for our theory.
Semiconductor lasers are particularly well suited for the implementation of pump-noise suppression, yielding a reduction of the intensity noise in the laser. In this simple picture, the maximal amount of squeezing is equal to the quantum efficiency. However, experimental results on intensity noise reduction by pump-noise suppression are usually above this limit. This discrepancy suggests that additional noise sources must be involved. Here we successfuly interpret the full noise behavior of a single-mode laser diode far above threshold by considering two excess noise sources: the leakage current fluctuations across the laser and the Petermann excess noise. We have estimated the contribution of each noise source using the results of the correlations between the laser output intensity noise and the voltage fluctuations across the laser diode (light-voltage correlations) and obtained good agreement between our theory and experimental results.
Both the junction voltage fluctuations and the frequency fluctuations of a semiconductor laser are highly correlated with its intensity noise. We analyze three schemes where the correlation information is used to reduce the intensity noise. In conventional semiconductor lasers, starting with intensity noise at the standard quantum limit, ideally 3-dB amplitude squeezing is possible. The influence of nonideal factors such as parasitics for junction voltage feedforward and the linewidth floor for frequency noise feedforward are discussed. It is shown that under certain conditions the number-phase uncertainty can reach the ultimate limit set by Heisenberg's uncertainty principle. These conditions are clarified, and examples are given for both conventional semiconductor lasers and microcavity lasers.
The quantum correlation between junction voltage fluctuations1/frequency fluctuations2 and the intensity fluctuations of a semiconductor laser may be used to reduce the intensity noise. Here we address squeezed-state generation discussing both fundamental and practical limitations on noise reduction in conventional semiconductor lasers and microcavity lasers. In conventional semiconductor lasers, starting with intensity noise at the standard quantum limit, ideally a 3-dB amplitude squeezing is possible. This fundamental limit is set by spontaneous emission noise. Another fundamental limit is that noise reduction beyond the level set by optical losses and pump noise is not possible. It is also shown that the number-phase uncertainty in some conditions can reach the ultimate limit set by Heisenberg’s uncertainty principle. These conditions are clarified and a comparison made between junction voltage and frequency noise feedforward. Feedforward schemes realizing intensity noise reduction are discussed.
Optimizing the sensitivity for interferometric measurement of optical phase involves maximizing the intensity of the illuminating light source and minimizing any noise sources. Limits to the light source intensity may arise from the availability of a stable high-power laser or from damage to the system being measured. For example, we describe here a scanning confocal polarization microscope designed to image the dynamics of nerve networks. In this case the light intensity limit is set by several factors, including the scanning rate, the required response time and damage limits of the biological system. Assuming a stable experimental configuration for the interferometer and light source, the limiting noise source for visible light interferometry is shot-noise associated with the quantum state of the light inputs to the interferometer. Shot-noise can be thought of as arising from vacuum fluctuations entering the dark input port of the interferometer.(1) These vacuum field fluctuations combine with the light entering the other port to cause shot-noise in the detected photocurrent at the output ports of the interferometer. This shot-noise current normally limits the measured phase variance Δϕ to a value of 1/N where N is the average number of photons detected in a measurement interval. We describe an experiment which demonstrates that this shot-noise limit can be improved by injecting squeezed vacuum into the normally dark input port.(2) In this case the phase variance is reduced below the 1/N limit by the degree of squeezing. In contrast to early experiments,(2) we are now operating the interferometer in a dark fringe mode(3–5) in order to avoid setting a limit to the light level caused by detector saturation (near 1 mW).
The intensity-noise properties of an injection-locked semiconductor laser were studied experimentally. The constant-current-driven semiconductor laser producing the amplitude-squeezed state whose intensity noise was reduced below the standard quantum limit (SQL) by 0.72 dB was injection-locked by an external master laser. The measured intensity-noise level of the injection-locked semiconductor laser was 0.91 dB below the SQL. This experimental result indicates that a phase-coherent amplitude-squeezed state or squeezed vacuum state together with a reference local oscillator wave can be generated directly by semiconductor laser systems.
We present comprehensive investigations on the polarization resolved quantum noise behavior of vertical cavity surface emitting lasers (VCSELs) with various cavity designs. These experiments are accompanied by detailed studies using a semiclassical approach, first, to calculate and model theoretically the amplitude fluctuations and correlations of a two orthogonal polarization-mode semiconductor laser as realized by a VCSEL, and second, to explore theoretically the squeezing potential of VCSELs. First, we find that the possible amount of squeezing with VCSELs should be superior as compared to edge emitting lasers for ideal single mode operation and under comparable pumping conditions. Second, we demonstrate that there exists the possibility of squeezing also in the two-mode regime besides sub-shot noise emission in the well known ideal single-mode operation regime configuring the recently published first experimental demonstration of the generation of amplitude squeezed light with VCSELs. Third, we demonstrate for the first time the generation of amplitude squeezed light by a lateral and polarization single mode VCSEL with the achievement of a maximum squeezing of 0.9 dB. Finally the future trends, the applications and the limitations of these non-classical states of light with respect to metrology applications are discussed.