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Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Index of refraction modifications accompanying absorptive optical bistability in a semiconductor doped glass filter

F. Pereira, Michael Scott Belsley, José R. Salcedo

Published Jan 28, 1999• 0 citations
Publisher

Abstract

We have characterized the transverse spatial dependence of the real and imaginary parts of the complex nonlinear refractive index of a semiconductor doped glass filter, which exhibits absorptive bistability. Using the Z-scan technique, combined with an interferometric measurement of the integrated optical thickness, we are able to fit the observed experimental data assuming a quadratically varying transverse temperature profile in the sample. The transverse variations in the nonlinear refractive index do not scale directly with the size of the incident beam, but exhibit marked asymmetries depending on whether the incident beam is converging or diverging.

DOI
10.1117/12.340059

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We have characterized the transverse spatial dependence of the real and imaginary parts of the complex nonlinear refractive index of a semiconductor doped glass filter, which exhibits absorptive bistability. Using the Z-scan technique, combined with an interferometric measurement of the integrated optical thickness, we are able to fit the observed experimental data assuming a quadratically varying transverse temperature profile in the sample. The transverse variations in the nonlinear refractive index do not scale directly with the size of the incident beam, but exhibit marked asymmetries depending on whether the incident beam is converging or diverging.
We have characterized the transverse spatial dependence of the real and the imaginary parts of the complex nonlinear refractive index of a semiconductor-doped glass filter that exhibits absorptive bistability. Using the Z-scan technique combined with an interferometric measurement of the integrated optical thickness, we are able to fit the observed experimental data, assuming a quadratically varying transverse temperature profile in the sample. The transverse variations in the nonlinear refractive index do not scale directly with the size of the incident beam but exhibit marked asymmetries that depend on whether the incident beam is converging or diverging.
Wherret et al.1 have derived a general condition for the existence of intrinsic optical bistability, stipulating that the absorption length of the sample, αL, must be less than 0.18. Nonetheless several research groups have observed optical bistability in samples with absorption lengths significantly above this limit.2 It has been suggested2 that the observed bistability is the result of an initial self-focusing of the incident beam brought about by thermal refractive index change which then induces a bistable effect in the final portion of the sample. If the focal length of the laser induced thermal lens is comparable with the sample thickness, then the reduction of the laser beam size could then induce bistability at a lower threshold in the final portion of the sample. We have carried a systematic test of this hypothesis, using a modified version of the Z-scan technique, on a commercially available semiconductor-doped glass filter.
A procedure to obtain optical bistability in a third-order nonlinear film (or parallel plate) of low refractive index without any external mirrors is investigated both theoretically and experimentally. If an s-polarized light is incident obliquely at a large angle of incidence on the film, the generation of optical bistability can be expected because of the resulting increase in the reflectivity at the surfaces. Arigorous analysis of the stationary transmission characteristics of the nonlinear film is done for both positive and negative nonlinear coefficients with a plane-wave model. In the experimental demonstration, a CdS(x)Se(1-x)doped glass (Hoya Y-52) plate and a cw Ar(+) laser are used as the nonlinear material and the light source, respectively. It is shown that three operations of optical bistability, optical limiting, and differential gain can be easily obtained through adjustment of the angle of incidence as an initial detuning. The measured nonlinearity is thermal, and the magnitude and sign of the nonlinear refractive index are determined.