Japanese Journal of Applied Physics
Visibility Measurement with an X-Ray Interferometer Using a Coincidence Technique
Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa
Abstract
A coincidence measurement was combined with conventional interferometry in the X-ray region. It was theoretically and experimentally shown that the coincidence counting rate between two output ports of an X-ray interferometer is directly related to the visibilities of the interference beams. The method developed here will be a powerful tool in constructing more general X-ray interferometers.