Physical review. B, Condensed matter
Temperature dependence of the homogeneous width of Eu3+ spectral lines in silicate glass measured by accumulated photon echoes
Ryuzi Yano, Masaharu Mitsunaga, Naoshi Uesugi, Makoto Shimizu
Abstract
The temperature-dependent homogeneous width of the $^{5}$${\mathit{D}}_{0\mathrm{\ensuremath{-}}}^{7}$${\mathit{F}}_{0}$ transition of ${\mathrm{Eu}}^{3+}$ in a pure silicate glass fiber has been measured by accumulated photon echoes between 1.6 and 44 K. The temperature dependence of the homogeneous width shows a crossover from T-linear (T7 K) to ${\mathit{T}}^{2}$ (T>7 K). The whole temperature dependence of the homogeneous width between 1.6 and 44 K can be explained by the configurational changes of the glass which is modeled by two-level systems (TLS's) and a Raman process involving low-frequency vibrational modes of the silicate glass (the rotations of ${\mathrm{SiO}}_{4}$ tetrahedra). The T-linear temperature dependence is attributed to the TLS process. The anomalous ${\mathit{T}}^{2}$ dependence down to 10 K cannot be explained by only one process, but can be explained by the contributions of both the TLS process and the Raman process. Above 40 K, the Raman process becomes the dominant dephasing mechanism.